AWR has just published a new Microwave Office® software application note titled, “End-to-end Design and Realization of an X-band Transmission Analyzer Using AWR Circuit, System, and EM Software.” The note examines the complete flow and details the design of several critical design elements for this device, which integrates many RF components on a single printed circuit board (PCB).
A new white paper from AWR, “Understanding and Correctly Predicting Critical Metrics for Wireless RF Links,” highlights the advantages of using Visual System Simulator™ (VSS) RF system simulation software for detailed insight into the full performance of an RF link in next-generation wireless products.
EDI CON 2013 (March 12-14, Beijing, China) has announced a special workshop focusing on connectivity challenges and innovations for high-frequency systems and instrumentation equipment to be held on March 14th at the Beijing International Convention Center.
EDI CON 2013 (March 12-14, Beijing, China), the industry-driven event for RF, microwave and high speed digital electronic design organized by Microwave Journal and Horizon House has announced its line-up of speakers for the opening plenary session to be held on March 12th at the Beijing International Convention Center.
AR RF/Microwave Instrumentation has announced the addition of Joseph DiBiase to its staff of application engineers. DiBiase will assist AR customers and provide support to various AR engineering groups.
Agilent Technologies Inc. will demonstrate its latest boundary scan analyzer, plus inline in-circuit and functional test systems at the IPC APEX EXPO, Feb. 19-21, at the San Diego Convention Center (Booth 2827) in San Diego, Calif.
Photo Stencil LLC, a leading full-service provider of high-performance stencils and tooling, will present the papers, Printing and Assembly Challenges for QFN Devices and Two Print Stencils Process at IPC APEX 2013. Videos of the presenters describing these papers can be found at www.photostencil.com/apex2013.php.