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Articles Tagged with ''test''

Agilent introduces industry's lowest-priced USB 2.0 signal-quality test option

Agilent Technologies Inc. introduced the industry’s lowest-priced USB 2.0 signal-quality test option. This option for the InfiniiVision 4000 X-Series oscilloscopes supports low-speed, full-speed and hi-speed USB applications. The USB interface is used extensively for computer applications and for a broad range of embedded connectivity applications.


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Wavefront and Anritsu to offer the first LTE/WCDMA pre-screen testing in Canada

Wavefront, Canada’s Centre of Excellence for wireless commercialization and research, and Anritsu Electronics Ltd., a leader in wireless test solutions, announce they have formed a partnership expected to lower the costs and increase the availability of long term evolution (LTE) development and testing in Canada for small and medium enterprise (SME) level businesses, device manufacturers, and mobile virtual network operators (MVNO). 


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EDI CON unveils new exhibitors presenting high-frequency connectivity products

EDI CON organizers have announced six new exhibitors for the show, which is taking place this March 12-14 in Beijing, China. Azimuth Systems, Microwave Vision Group, Times Microwave, Insulated Wire (IW), Southwest Microwave and Tower/Jazz join the list of exhibitors and speakers at this industry-driven high-frequency electronics event.


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Rohde & Schwarz to present enhanced oscilloscopes at embedded world 2013

New bandwidths, mixed-signal analysis and options for testing USB interfaces, CAN LIN buses and audio signals: Rohde & Schwarz significantly expanded its oscilloscope portfolio in 2012. At the embedded world 2013 trade fair in Nuremberg (hall 4, booth 112), the company will present its latest applications, two new probes and other state-of-the-art products.


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