W. L. Gore & Associates (Gore) continues to enhance the company’s microwave/RF solutions to operate at higher frequencies while performing reliably over time. Gore will be featuring several new developments at IMS2017, June 6-8, at the Hawaii Convention Center, Honolulu, Booth #1740.
At IMS2017, Gore will showcase the upgraded GORE® VNA Microwave/RF Test Assemblies, now offering stable, reliable performance up to 70 GHz. This upgrade addresses industry requirements for enhanced performance in the 60 to 70 GHz range where there is increased need to maintain measurement accuracy.
Throughout the show, Gore will be demonstrating the performance of GORE® PHASEFLEX® Microwave/RF Test Assemblies, Type 0N while attached to a Rohde & Schwarz analyzer. These are the smallest, lightest, most internally ruggedized assemblies on the market today for modular, multi-port and multi-site test applications, ensuring consistent, repeatable measurements with stable electrical performance up to 50 GHz.
Another ongoing, live demo will be of the phase and amplitude stability with flexure of GORE® PHASEFLEX® Microwave/RF Test Assemblies. These assemblies perform reliably over time without any physical changes, meaning these cable assemblies maintain electrical and mechanical integrity in environments where the other assemblies would be compromised.
Gore will also be giving a MicroApps presentation: “The 5G Communication Test: Test & Measurement Cable Assembly Challenges and Solutions,” by David Zheng, Thursday, June 8, 10:40 a.m., Booth #1946.
For more information, see Gore at IMS2017 Booth #1740, visit gore.com/electronics.