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Agilent Technologies Inc. (NYSE: A) today introduced a 12 GHz differential wafer probing solution. The fine-wire probe tip is a high-fidelity, high-bandwidth solution that allows R&D and test engineers to debug and test high-speed active ICs using an oscilloscope.
The N2884A InfiniiMax differential fine-wire probe tip uses Agilent's low-cost, ZIF probe head technology, which provides a flat frequency response over the entire 12 GHz bandwidth specification. The tip eliminates the distortion and loading that affect probes with in-band resonance. The N2884A measures a voltage versus an adjacent local ground or other node on the device under test. Other solutions measure a voltage versus a ground distant from the probe point. The technique used by the N2884A delivers better common mode noise rejection and superior signal integrity in measurements, allowing engineers to experience fewer probing effects when they debug designs for higher-speed devices.
The N2884A comes with a probe arm and a set of five probe tips. The probe arm is compatible with the Wentworth Laboratories micropositioner.
Information about the Agilent N2884A InfiniiMax differential fine-wire probe tip is available at our website.
U.S. Pricing and Availability
The Agilent N2884A InfiniiMax differential fine-wire probe tip is available now at a price of $1,800.
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