Transmission-Line Components

Data Sheet for the .141 eSMA

Data Sheet for the .086 eSMA

Data Sheet for eSMA Cable Assemblies

Value and flexibility for high frequency commercial and military test requirements.

Device measurement, model parameter extraction, embedded circuit simulation, and model generation–ready for EDA implementation.

Isothermal IV curve generation from arbitrary bias conditions of semiconductor devices in a flexible, rapidly-deployable, cost-effective measurement system.

The most accurate and cost-effective solution for standard model development requirements.

Accurate and efficient model parameter extraction from pulsed IV and pulsed RF measurements in a complete, turn-key system.

Digitally controlled, precision electronic and mechanical tunerbased large signal characterization of semiconductor devices for the RF, Microwave and Millimeter Wave industry

Digitally controlled, precision electronic and mechanical tunerbased small signal characterization of semiconductor devices for the RF, Microwave and Millimeter Wave industry