Pat Hindle, MWJ Editor
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Pat Hindle is responsible for editorial content, article review and special industry reporting for Microwave Journal magazine and its web site in addition to social media and special digital projects. Prior to joining the Journal, Mr. Hindle held various technical and marketing positions throughout New England, including Marketing Communications Manager at M/A-COM (Tyco Electronics), Product/QA Manager at Alpha Industries (Skyworks), Program Manager at Raytheon and Project Manager/Quality Engineer at MIT. Mr. Hindle graduated from Northeastern University - Graduate School of Business Administration and holds a BS degree from Cornell University in Materials Science Engineering.

Provoking Panels at EDI CON USA 2017 - GaN and 5G mmWave

High performance GaN and 5G mmWave systems will be debated and discussed

August 4, 2017

Please join us for two provacative panels at EDI CON USA 2017 covering High Performance GaN Technology and 5G mmWave Systems & Test. I will be moderating these - should be an interesting and lively discussion with some of the best experts in the field.

“The Ferrari of amplifiers – How can we maneuver around the current challenges facing high performance GaN”
Sept 12th, Tues 4:30-5:30, Frequency Matters Theater (exhibition floor)

This panel session will explore the challenges and solutions for high performance GaN amplifiers including substrate choice (SiC versus Si versus diamond), packaging and thermal issues, space qualification, high efficiency design techniques (envelope tracking versus various outphasing techniques) and reducing overall SWAP-C.

Expert Panelists from Raytheon, BAE, ADI, MACOM, Integra, Qorvo:

Tom Kazior, Engineering Fellow, Raytheon
Scott Sweetland, Director, Advanced Microwave Products, BAE Systems
Keith Benson, Director of RF/MW Amplifier Products, ADI
Tim Boles, Technology Fellow, MACOM
Gabriele Formicone, Director RF Transistor Design, Integra Technologies
Matt Poulton, Director of Design Engineering for High Performance Solutions, Qorvo

“Bandwidth or Bust – Commercializing 5G mmWave Technology Today”
Sept 13th, Wed 1-2:30 pm, Room 107

This panel session will explore the challenges and solutions to commercializing 5G mmWave communications with today’s semiconductor and test technology. Experts from leading semiconductor and test/measurement companies will discuss the latest innovations and results from tests and trials.

Expert Panelists from Anokiwave, ADI, Qorvo, Anritsu, NI and R&S:

Shmuel Ravid, Chief Engineer, Anokiwave
Etienne Moulin, Director of Systems Engineering, Analog Devices
Scott Vasquez, Senior Product Line Manager, Qorvo
Walt Strickler, Product Marketing Manager, Anritsu
Michael Schneider, Principal Marketing Manager, National Instruments
Chris Scholz, North American Product Manager for VNAs, R&S

Let me know if you have any questions about these topics you have been wondering about and maybe we can address them.

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