David Vye, MWJ Editor
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David Vye is responsible for Microwave Journal's editorial content, article review and special industry reporting. Prior to joining the Journal, Mr. Vye was a product-marketing manager with Ansoft Corporation, responsible for high frequency circuit/system design tools and technical marketing communications. He previously worked for Raytheon Research Division and Advanced Device Center as a Sr. Design Engineer, responsible for PHEMT, HBT and MESFET characterization and modeling as well as MMIC design and test. David also worked at M/A-COM's Advanced Semiconductor Operations developing automated test systems and active device modeling methods for GaAs FETs. He is a 1984 graduate of the University of Massachusetts at Dartmouth, with a concentration in microwave engineering.

EuMW08 Day 1

October 28, 2008

Daniel Ong and Brian Battaglia of HVVi Semiconductor
stop by as we are setting up the MWJ Stand at EuMW 2008
on Monday afternoon.


The rain is back and so are the attendees as the first day of the EuMW gets underway. Traffic on the floor was heavy throughout most of the day, especially by mid-afternoon. Richard Mumford and I started our day with a local camera crew, conducting "in-stand" interviews with representatives from companies participating with our Virtual Trade Stands on the MWJ Online Show Daily Site.


Richard took the bulk of European-based companies (Rohde & Schwarz, CST) as well as Keithley, while I met with M/A-Com Technology Solutions (the new commercial business sector of M/A-Com Cobham); AWR Corp.; Triquint Semiconductor and Anritsu.

The video team will be working through the night editing the video so that we can post these interviews by the start of business on Wednesday. Please check in to see what these companies are saying about their latest technologies and impressions of EuMW.

Lots of presence from test and measurement vendors, simulation software providers, foundries, and component manufacturers. I'm hearing lots of buzz over infrastructure (backhaul), defense, millimeter-wave opportunities, the need for speed in test & measurement, cost-conscious solutions, .... did I mention millimeter-waves (Agilent was showing off its 500GHz VNA among a number of exciting test solutions).

National Instruments had a very interesting demo of its RF Multi-protocol Test System, Auriga is here with its active device characterization system - sharing a stand with a harmonic load-pull measurement system from Focus Microwave and at the Microave Journal stand we are previewing the upcoming Microwave Journal China site (sorry - you have to be here to see it) and giving away "wicked cool" MWJ Tee-Shirts.

We have lots of companies to visit tomorrow, so stay tuned for our next update.

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