David Vye, MWJ Editor
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David Vye is responsible for Microwave Journal's editorial content, article review and special industry reporting. Prior to joining the Journal, Mr. Vye was a product-marketing manager with Ansoft Corporation, responsible for high frequency circuit/system design tools and technical marketing communications. He previously worked for Raytheon Research Division and Advanced Device Center as a Sr. Design Engineer, responsible for PHEMT, HBT and MESFET characterization and modeling as well as MMIC design and test. David also worked at M/A-COM's Advanced Semiconductor Operations developing automated test systems and active device modeling methods for GaAs FETs. He is a 1984 graduate of the University of Massachusetts at Dartmouth, with a concentration in microwave engineering.

ROHDE & SCHWARZ GOES TOP SECRET

February 11, 2009
by Richard Mumford, MWJ European Editor

As a leading supplier of test and measurement solutions for wireless communications and with over 75 years of experience of driving innovation, Rohde & Schwarz will showcase its MIMO, 3GPP LTE, HSPA+, WiMAX™ and Edge Evolution in Hall 1, Stand D59. A new addition to the portfolio is the R&S CMW500 test platform solution that performs all relevant wireless device tests, especially for LTE and HSPA+. When equipped with the appropriate hardware and software components, the R&S CMW500 can perform T&M tasks ranging from RF and protocol tests up to complex application tests.

The company will also highlight two new models of the recently launched R&S FSV family. These two combination signal and spectrum analyzers have been expanded for applications up to 13.6 GHz and 30 GHz, respectively.

In addition Rohde & Schwarz SIT GmbH, a leader in the German crypto market, will display the latest version of its compact mobile voice encryption device that protects confidential mobile phone calls. The TopSec Mobile can be used together with state-of-the-art mobile phones due to its plug & play functionality and Bluetooth® interface.

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