David Vye, MWJ Editor
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David Vye is responsible for Microwave Journal's editorial content, article review and special industry reporting. Prior to joining the Journal, Mr. Vye was a product-marketing manager with Ansoft Corporation, responsible for high frequency circuit/system design tools and technical marketing communications. He previously worked for Raytheon Research Division and Advanced Device Center as a Sr. Design Engineer, responsible for PHEMT, HBT and MESFET characterization and modeling as well as MMIC design and test. David also worked at M/A-COM's Advanced Semiconductor Operations developing automated test systems and active device modeling methods for GaAs FETs. He is a 1984 graduate of the University of Massachusetts at Dartmouth, with a concentration in microwave engineering.

R&S Demos Femtocell Design Verification

March 31, 2009

David Vye

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At CTIA Wireless 2009, Rohde & Schwarz is demonstrating their LTE frequency division duplexing (FDD) testing capabilities based on the newest femtocell design from mimoOn. The compact test setup features the R&S® SMBV100A vector signal generator and the R&S® FSV signal analyzer to generate and analyze LTE signals that meet the newest specification.

The test setup on display at Rohde & Schwarz booth 6033 verifies that the femtocell reference design from mimoOn correctly operates according to the LTE specification that is about to be finalized. Accurate validation of the generated downlink signal of the mimoOn reference design is carried out with the R&S® FSV signal analyzer and the R&S® FSV-K100 downlink analysis option. The R&S® FSV’s innovative touch screen interface simplifies testing from the reference design to the final application of enhanced Node B (eNB) and Home eNB infrastructure.