Articles by David A. Hall, National Instruments, Austin, TX; Steve Narciso and Jared Richard, Agilent Technologies Inc., Santa Clara, CA; Edited by David Vye, Mic

PXI Modules Offer Speed, Scalability and Small Form Factor for RF Measurement Systems

The emergence of new wireless standards and the growing adoption of wireless radios in the consumer world have created new RF test challenges for engineers. With consumer devices using more radios and engineers performing more RF measurements than ever before, it has become increasingly clear to the industry that...
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