Test & Measurement Channel - Leading Manufacturer News, Articles & Content

Agilent Introduces IC-CAP WaferPro Software

Agilent Technologies Inc. announced Integrated Circuit Characterization and Analysis Program (IC-CAP) Wafer Professional (WaferPro) software. The new software provides a multi-site, multi-wafer, automated DC and RF measurement solution for semiconductor device modeling applications. WaferPro allows users to control semiautomatic and fully automatic probe stations. With support for the latest...
Read More