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David Vye, Technical Editor, Microwave Journal: We had the pleasure of speaking with Ms. Sherry Hess, vice-president of Marketing at AWR®. Ms. Hess recently joined AWR, bringing with her nearly 20 years of senior management, sales, marketing and international business development experience in the semiconductor and EDA industries. Prior...

David Vye, Technical Editor, Microwave Journal : Microwave Journal had the pleasure of speaking with Mr. Todd Cutler who is currently a Senior Manager with Agilent Technologies’ EEsof EDA Division, responsible for Marketing, Services, and the ESL Business. In his 28-year career, he helped to found the division, which...

Easy-to-Use Agilent N9330A Provides Key Test Functionality Ideal for Cable and Antenna Installation and Maintenance

Fast digital functional test with the R&S CompactTSVP open test platform

New R&S TS-PHDT module for testing complex electronic circuits

Rohde & Schwarz today announced that it will introduce the R&S CMW270, a single-instrument solution for evaluating the performance of components and subsystems designed to be deployed in mobile WiMAX (IEEE-802.16e) applications at the WiMAX World exhibition in Chicago on September 26.

gilent Technologies Inc. (NYSE: A) today introduced the world's first LXI trigger box that enables precise synchronization over LAN for LXI Class C and GPIB instruments, elevating their performance to LXI Class B standards.

Fast digital functional test with the R&S CompactTSVP open test platform

Fast digital functional test with the R&S CompactTSVP open test platform

Agilent Technologies Inc. (NYSE: A) today announced the industry's first oscilloscope-based DDR3 compliance test application.