RF & Microwave Industry News

Gallium Nitride Powers New Amplifier Range

A new range of high power, broadband amplifiers has been developed to capitalize on the inherent advantages of Gallium Nitride (GaN). With instantaneous bandwidths of 2 to 6 GHz and high reliability, the AS0206 family of amplifiers is well suited to several markets. In particular, its inherent reflected-power tolerance...
Read More

New Literature

Switch Selection Guide Agilent’s new “RF and Microwave Switch Selection Guide” provides comprehensive information on the company’s entire portfolio of switches. The guide provides an overview of electromechanical and solid-state switches and switch drivers. Characteristic switch parameters such as switching speed, isolation and insertion loss including typical applications and...
Read More

Career Corner

Short on RF Engineers? Consider H1B This column advocates for considering non-US professionals to fill in the steadily growing shortage of RF engineers. In addition to presenting the practical and fiscal advantages, this article also highlights the contribution of “imported” engineering talent to securing future domestic jobs. Unlike the...
Read More

High-frequency Technology for the Global Market

Heuermann HF-Technik GmbH founded as a spin-off of Aachen University of Applied Sciences
It all started with the idea of revolutionizing time measurement in motor racing, using a portable lap-timing system. After two years of research, Prof. Dr.-Ing. Holger Heuermann and his colleague Dipl.-Ing. Kai Hanisch successfully tested their microwave transponder-based laptiming system, MicroLap. Unlike conventional systems, Microlap allows for accurate chronometry...
Read More

European Radar Conference

Amsterdam, 30-31 October 2008
The 5 th European Radar Conference (EuRAD) will be held from 30 to 31 October 2008 in Amsterdam, the Netherlands, as part of European Microwave Week. The 5 th European Radar Conference is the major European forum to present the current status and future trends in the field of...
Read More