With the increasing complexity of RF systems, more components are becoming part of the RF block diagram. While reliability concerns focus on the power amplifier, any components subject to high RF drive must be qualified. The modular architecture of the Accel-RF HTOL Burn-In System provides the flexibility to qualify multiple device types at a low-cost per channel and minimal lab footprint.

The rack configuration has all power supply control and power control unit (PCU) modules embedded and controlled through the LIFETEST software and system controller. Auto biasing for gate/base and drain/collector levels, maximum allowable levels and on/off sequencing are programmable in the PCU setup. Each device being tested is independently sourced and controlled, with temperature control and monitoring done independently and individually per device channel. Temperature setting and control are managed through the LIFETEST software with continuous updates and control possible.

The HTOL Burn-In System enables high channel capacities with an expandable tray design, using chilled water to remove heat. The system design offers a range of DC bias options, from high-resolution, low-power supplies for small devices—GaAs HBT or SiGe—to high current supplies for high-power RF devices—GaN or LDMOS. Numerous frequency bands and RF drive levels are supported.

Founded in 2003, Accel-RF helped enable industry adoption of compound semiconductor transistors and MMICs in space, military and commercial markets. It supplies reliability test systems to top-tier semiconductor and aerospace/defense users in the U.S., Europe and Asia. Accel-RF is the only provider of fully integrated, scalable, turnkey systems that provide dynamic, multi-dimensional, RF, DC and temperature testing with a single platform.

San Diego, Calif.