Dr. Christopher Harris, European business development manager at Cree, Inc., will present “Using Cree® GaN Large Signal Models in Microwave Office Simulation Tools” at the RF/Microwave PA Forum at European Microwave Week (EuMW), October 7-9, 2014 in Rome, Italy. The RF/Microwave PA Forum, scheduled to span 9:30 a.m. to 4:00 p.m. on Tuesday, October 7, is one of many EuMW workshops, courses, and seminars that will be presented by representatives from several organizations renowned for their expertise in microwave, RF, wireless, and radar.
Free to attend, the RF/Microwave PA Forum is segmented into four sequential sessions designed to foster discussion about and provide insight into the latest approaches to device models, measurements for parameter extraction, process technologies, and modern power amplifier design flow and theory. One of three session III presentations, all of which focus on device technology, “Using Cree GaN Large Signal Models in Microwave Office Simulation Tools” is scheduled for 1:45 to 2:05 p.m. on Tuesday, October 7, in the Ottavia room at the Fiera di Roma Convention Center. In this presentation, Dr. Harris will discuss the latest enhancements to the models, which enable advanced harmonic engineered designs, as well as address how the extreme accuracy of Cree GaN HEMT models under a broad range of operating conditions can be used to replicate the exact behavior of the devices in high frequency circuits. Already proven to be a critical asset to the development of many hundreds of successful hybrid and MMIC designs, Cree’s enhanced large signal models enable even more first pass design successes, preserving both critical design cycle time and financial investments.
Please visit http://ow.ly/C5z5T for more information about the RF/Microwave PA forum, http://www.eumweek.com/ for more information about EuMW, and http://cree.com/rf for more information about Cree RF.