What: The new Power of X application notes provide insight into solving tough measurement problems in a unique way for both the design and manufacturing environments. The new “Power of X” application note topics:
• Solutions for Testing LTE FDD and TDD Performance - Ensuring Simpler, More Cost-Effective Conformance Testing of LTE Base Stations, 5990-5657EN;
• Solutions for Memory Effects in Microwave Components - X-Parameters to Characterize and Model Long-Term Memory Effects of Wideband Modulated Signals, 5990-5799EN.

Agilent’s X products help engineers bring innovative, higher-performing products to emerging markets around the globe.

When: Available today

Where: to request copies of the free application notes go to www.agilent.com/find/powerofx Registration is required