February 26, 2010

What: These complimentary CDs are packed with timely information to help overcome test challenges.

Digital Test: How to Master the High-Speed Test Challenge
If you develop embedded designs, you face big challenges when it comes to characterizing forward-clocked memory, CPU interfaces and high-speed digital devices based on PCIe(tm)2, USB, DisplayPort, HDMI and MIPI. Learn about the test requirements of your designs and get answers to your questions about compliance testing of next-generation multigigabit interfaces.

Photonic Test: Be Ready for 40/100G Optical Networks and Components
Get ready for the transition to next-generation networking technology. This series of presentations covers test requirements for high-speed communication systems/components and advanced signal and modulation principles. Explore ways to test transients of reconfigurable network elements and measure the polarization and dispersion behavior of new component and network designs.

When: Starting March 1, 2010, online

Where: For further details and ordering: www.agilent.com/find/webcastcds-dpt