Pat Hindle, MWJ Editor
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Pat Hindle is responsible for editorial content, article review and special industry reporting for Microwave Journal magazine and its web site in addition to social media and special digital projects. Prior to joining the Journal, Mr. Hindle held various technical and marketing positions throughout New England, including Marketing Communications Manager at M/A-COM (Tyco Electronics), Product/QA Manager at Alpha Industries (Skyworks), Program Manager at Raytheon and Project Manager/Quality Engineer at MIT. Mr. Hindle graduated from Northeastern University - Graduate School of Business Administration and holds a BS degree from Cornell University in Materials Science Engineering.

Microwave Trade Show Season in Full Bloom

May 1, 2012

The busiest part of our trade show season is underway now. Wamicon in Cocoa Beach, FL recently took place April 15-17. The conference included two-day two-track technical sessions addressing up-to-date multidisciplinary research needs and interdisciplinary aspects of wireless and RF technology. More than two dozen exhibitors and sponsors in RF and microwave area displayed at the conference. Here is our complete Wamicon show summary.

At the same time, Editor David Vye was attending the EMC International Exhibition in Beijing, China. This was co-located with the EMC Market Development High-Tech Forum. Our latest Microwave Journal China issue was distributed at the show. See David’s photo gallery covering his visit.

I am off this week to visit Hong Kong and attend the Microwave Wireless Industry Exhibition (MWIE2012) in Shenzhen. This should be another interesting show to introduce Microwave Journal China and other initiatives for our Chinese speaking audience. A full report will be available next week.

Next week, most of the the MWJ staff will be attending CTIA 2012 in New Orleans. Our RF/Microwave Zone is sold out this year with about 20 companies exhibiting. In addition, we are running two expert panel sessions covering MIMO/LTE challenges. The first session is on Wed, May 9 on "Over-the-air Challenges and Implications – Recommendations for LTE RAN" and the second is on Thurs, May 10 on "MIMO OTA Measurements – The Next Generation Platform for Wireless Testing."

Then, the big finale is the IMS MTT-S in Montreal June 17-22 where everyone will converge for the largest microwave show of the year. Microwave Journal will have an Online Show Daily micro-site starting May 15 covering all the news, products, conferences, exhibition happenings and more. MWJ will be organizing two special panel sessions at IMS. The first is in cooperation with Strategy Analytics on Wed, June 20 at 8 am (room 516) covering "Where are the Market Opportunities for GaN." The second is on Wed at 10 am in the MicroApps Theater covering "Device Characterization Methods & Advanced RF/Microwave Design." In addition, MWJ will be having a daily drawing for anyone who completes our May Show issue Puzzler in the back of the magazine. We will be around the exhibition all week taking photos, videos, performing interviews and talking to all of our colleagues. Don't miss our May show issue coming out soon.

So put on your comfortable walking shoes and join us at some of these events. You can follow our crew on Twitter, touch base with us on Facebook and keep up to date with our LinkedIn Group, the RF and Microwave Community.