UK neutron scientists are tackling the challenge of cosmic radiation and its damaging effect on sensitive microchips in the aviation industry in the drive to develop more robust electronic equipment. Accelerated testing of microelectronic components at the Science and Technology Facilities Council’s (STFC) ISIS neutron research centre replicates the effect of thousands of hours of flying time in just a few minutes.
Initial tests occurred at the end of 2006 at the ISIS neutron source in Oxfordshire, UK, and a £140 M new ‘target station’ or neutron source is in the final stages of completion alongside the original ISIS neutron source. The plan, subject to funding, is for the ISIS Second Target Station to include a dedicated and full-time instrument to test the effects of Single Event Effects (SEEs) and chip irradiation.
Results from this testing will allow manufacturers to mitigate against the problem and build triple redundancy into their electronic components. This increased confidence in the quality of electronic systems will help to make both civil and military aircraft safer.
Chris Frost, project leader of chip irradiation research at the ISIS neutron source, explained, “At ISIS we have the ability to produce intense beams of neutrons with similar energy ranges to those occurring naturally. This enables accelerated reliability testing of microelectric elements used in the aerospace industry. Once manufacturers understand where the biggest susceptibility problems lie, they can begin to redesign circuitry on a more robust basis.”