ARFTG Explores Emerging Measurement Techniques
“Measurement for Emerging Technologies” was the theme of the ARFTG Microwave Measurement Symposium held November 28th to December 1st in Broomfield, CO. The symposium consisted of four events over four days: the NIST/ARFTG Microwave Measurement Short Course (all day Tuesday and Wednesday morning), a Nonlinear Measurement Workshop (Wednesday afternoon), the NVNA Users’ Forum (Wednesday evening) and concluded with the symposium main event – the 68th ARFTG Microwave Measurement Conference (Thursday and Friday).
The NIST/ARFTG Microwave Measurement Short Course is a highly successful event providing expert training in most areas of interest to today’s RF and microwave measurement community. The Nonlinear Measurement Workshop theme was “RF Samplers” with presentations ranging from the basics, to VNA and oscilloscope applications, and electro-optic sensors. The NVNA User’s Forum is an informal discussion group devoted to sharing information and issues relating to instrumentation used in vector large-signal network analysis of nonlinear circuits and systems.
The 68th ARFTG Microwave Measurement Conference technical program was particularly strong with six technical sessions including one interactive session featuring papers presented in poster form. All papers have been published in the conference digest CD, which can be ordered from www.arftg.org.
ARFTG is soliciting submissions for the next two conferences. The 69th conference will be held June 8th in conjunction with the 2007 International Microwave Symposium in Honolulu, HI. The theme of the spring conference is “Addressing Metrology Needs for Future High-Speed Information and Communication Systems.” The 70th conference will be held in December 2007 in Tempe, AZ. The theme of the fall conference is “High Power RF Measurement Techniques." Paper submissions are invited in any of the topic areas related to microwave measurement. Details are available at www.arftg.org.