advertisment Advertisement
advertisment Advertisement
advertisment Advertisement
advertisment Advertisement
Industry News

Agilent Demonstrates In-Circuit and Functional Test Solutions at IPC APEX EXPO

February 13, 2012
/ Print / Reprints /
| Share More
/ Text Size+

SANTA CLARA, Calif.,Feb. 13,2012 –Agilent Technologies Inc. (NYSE: A) will demonstrate in-circuit and functional test solutions at the IPC APEX EXPO, Feb. 28-March 1, at the San Diego Convention Center (Booth 2817) in San Diego, Calif. 

Agilent experts will demonstrate:

  • The low-cost Medalist i1000D ICT, with an integrated board handler for smart phone, LED, automotive fuse box and limited-access tests. (The i1000D includes digital testing, boundary scan and serial programming capabilities.)
  • The  Medalist i3070 Series 5 in-circuit test system, featuring ICT inspection of LEDs, an easy-to-use interface, and an award-winning suite of limited-access test products.
  • The i1000DTS diagnostics test set, a custom, modular ICT-featured instrument for use in R&D, repair and functional test, providing faster prototype turn-on and precise repair diagnostics.
  • The low-cost ICT fixturing solutions for the i1000D with Agilent solution partner InterLatin.

Additional information is available at

Recent Articles by Agilent Technologies Inc., Santa Clara, CA

Post a comment to this article


Forgot your password?

No Account? Sign Up!

Get access to premium content and e-newsletters by registering on the web site.  You can also subscribe to Microwave Journal magazine.


advertisment Advertisement