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Industry News

EuMW MicroApps 2011

September 6, 2011
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MicroApp presentations are given by registered EuMW 2011 exhibitors and are open to all exhibition attendees. MicroApps features practical application papers describing novel products and processes of interest to the microwave community. The MicroApps auditorium is on the exhibition floor.

Agenda
Tuesday 11th October

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10:00 - 10:30
KEY NOTE: The Future of EDA
Chris Paris, AWR Corporation

10:30 - 11:00
High Frequency Instructional Toolkit
Ansys

11:00 - 11:30
Pulsed S-Parameter Measurements Using PXI Instruments
National Instruments

11:30 - 12:00
Practical Methods for Estimating the Q of Spiral Inductors Using EM Planar Simulators
AWR Corporation

12:00 - 12:30
Understanding the Proper Dielectric Constant of High Frequency Laminates to Be Used for Circuit Modeling and Design
Rogers Corporation

12:30 - 13:00
New General Tool for RF High Power Breakdown Prediction
Aurora Software and Testing S. L.

13:00 - 13:30
STAN Tool: A New Method for Linear and Nonlinear Stability Analysis of Microwave Circuits
AMCAD Engineering

13:30 - 14:00
New Rotary Joint Product Lines For SATCOM Applications
Spinner

14:00 - 14:30
Simulation and Evaluation of Communications Systems in Conformance With Third- and Fourth-Generation Wireless Standards
AWR Corporation

14:30 - 15:00
The Perfect VNA Measurement is the Enemy of the Good VNA Measurement
National Instruments

15:00 - 15:30
HFSS 13: Hybrid FE-BI method for Efficient Simulation of Radiation and Scattering
Ansys

15:30 - 16:00
IQ Mixer Measurements: Techniques for Complete Characterization of IQ Mixers Using a Multi-port Vector Network Analyzer
Agilent Technologies

Wednesday 12th October

10:00 - 10:30
KEY NOTE: CAD, the RF Innovator's Sanity Check and Reputation Preserver
Dr. Steve C. Cripps, Hywave Associates

10:30 - 11:00
Tools for Creating FET and MMIC Thermal Profiles
AWR Corporation and CapeSym

11:00 - 11:30
Maximizing VSA Dynamic Range Through Appropriate IF Path Selection
National Instruments

11:30 - 12:00
Design and Test of Radar Systems
AWR Corporation and Rohde & Schwarz

12:00 - 12:30
Applications and Techniques for Low Phase Noise Signal Generation
Agilent Technologies

12:30 - 13:00
Advancements in R&S VNAs Reveal the Large-signal behavior of RF Components
NMDG and Rohde & Schwarz

13:00 - 13:30
Active and Hybrid Load Pull - A Paradigm Shift
Maury Microwave Corporation

13:30 - 14:00
On-Wafer CW and Pulsed Testing of mmWave Devices
Presto Engineering, Inc.

14:00 - 14:30
NVNA (NonLinear Vector Network Analyzer) called "SWAP-X402" for Time-Domain Load-Pull
Verspecht-Teyssier-DeGroote

14:30 - 15:00
Vector-Receiver Load Pull - Measurement Accuracy at its Best
Maury Microwave Corporation

15:00 - 15:30
Beyond the S-Parameter: The Benefits of Nonlinear Device Models
AWR Corporation

Thursday 13th October

10:00 - 10:30
Advances in Signal Analyzer Noise Floor and Dynamic Range
Agilent Technologies

10:30 - 11:00
Mixed-Signal Active Load Pull - The Fast Track to 3G/4G Amplifier Design
Anteverta-mw and Maury Microwave Corporation

11:00 - 11:30
Improved Soldering Techniques for Cylindrical RF Connectors Using HIG Induction Technology
iTherm

11:30 - 12:00
Local Fundamental Frequency Enhancements for X-Parameter Models
Agilent Technologies

12:00 - 12:30
A Comparison of Noise Parameter Measurement Techniques
Maury Microwave Corporation

12:30 - 13:00
Design for Manufacturing: Yield Analysis During EM Simulation
AWR Corporation

13:00 - 13:30
Novel Re-manufacturing Process For a New Composite Incorporating PTFE/GF Recyclate Produced from PTFE/GF Laminate Manufacturing and End of Life Waste
Trackwise

13:30 - 14:00
HFSS Solver On Demand
Ansys

14:00 - 14:30
Mind Your Reference Plane
National Instruments

14:30 - 15:00
Millimeter Wave Range Vacuum Microwave Sources and its Application
JSC "Pluton"

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