The most important part of the ARFTG experience is the opportunity to interact one-on-one with colleagues, experts and vendors of the RF and microwave test and measurement community. Whether your interests include high-throughput production or one-of-a-kind metrology measurements, complex systems or simple circuit modeling, small signal S-parameter or large-signal non-linear measurements, phase noise or noise figure, DC or lightwave, you will find a kindred spirit or maybe even an expert.
There is always ample opportunity at every ARFTG conference for detailed technical discussions with others facing similar test and measurement challenges. The members of ARFTG often find that these interactions are their best source of ideas and information for their current projects. So come and join us at our next conference. You’ll find that the atmosphere is informal and friendly.
Calling for Papers - February 15th