Pat Hindle, MWJ Editor
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Pat Hindle is responsible for editorial content, article review and special industry reporting for Microwave Journal magazine and its web site in addition to social media and special digital projects. Prior to joining the Journal, Mr. Hindle held various technical and marketing positions throughout New England, including Marketing Communications Manager at M/A-COM (Tyco Electronics), Product/QA Manager at Alpha Industries (Skyworks), Program Manager at Raytheon and Project Manager/Quality Engineer at MIT. Mr. Hindle graduated from Northeastern University - Graduate School of Business Administration and holds a BS degree from Cornell University in Materials Science Engineering.

Going Non-linear

October 1, 2009
Like at IMS, there was a lot of buzz about various new non-linear characterization techniques at EuMW 2009. X-parameters from Agilent seem to be catching on and they now have many case studies/examples that show the benefits or using them. There is also S-functions from NMDG which was in the Rohde & Schwarz booth and MWJ has an article in the Sept issue covering their non-linear extensions. I also visited with Heuermann HF-Technik GmbH which is also involved with non-linear measurement and provides software that will work with any NVNA for automation of non-linear measurments.

Mesuro is working with Tektronix and has developed a high performance active load pull system that simplifies and speeds up the measurement and characterization. This lead me to check out the load pull companies such as Maury and Focus. Maury has added a high power capability so you can test X-parameters at up to 25 or 50 Watts and impedance can be a variable now. They have drag and drop capability for file import into ADS. Focus has also improved their system greatly with the measurements made before the tuners so calibration only has to be performed once and the results are more accurate.

A group of companies including Anritsu, AWR, HFE, Mesuro, NMDG, R&S and Tektronix have joined to create the Openwave Forum. The alliance seeks to standardize the data format for the industry so that customers have the choice of tools, equipment and vendors to use. You can visit their web site at

There is a lot of information out there on these new techniques and models so we hope to bring you future articles and information that will sort it all out. Our March Test and Measurement issue will also cover the subject in detail.
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