White Papers

The LO harmonic effects on I/Q errors and sideband suppression (SBS) in the RF modulator was analyzed in application report SLWA059. This application report further investigated LO harmonic effects when attempting to achieve an increased level of SBS performance.

The introduction of this digital transmission technology has made it necessary to deal with peak power levels up to 20 dB above the average value. All of the RF power components must be capable of handling these high voltage peaks to avoid break down, or flash over.

National Instruments has redefined the traditional approach by combining PXI hardware and NI LabVIEW system design software, leveraging commercial technologies such as multicore microprocessors, user-programmable FPGAs, PCI Express hardware, and system design software to meet the flexibility and scalability demand for future high-frequency test and measurement applications.

Agilent April White Paper

Rise/fall time is one of the key measurement parameters when designing, manufacturing or maintaining pulsed radar power amplifier systems, especially for wideband pulse power amplifiers. Learn how to achieve 5 nanosecond rise/fall time RF pulse measurement with the 8990B peak power analyzer by reading this application note. This article also includes tips on how to consistently obtain accurate rise/fall time measurement results.

Shifting landscapes suggest RF/Microwave companies keep manufacturing closer to home. The outsourcing decision for RF/Microwave (RF/MW) companies, however, has a unique set of circumstances when compared to conventional digital electronics.

This white paper summarizes the technology options for supporting voice and short message service (SMS) in LTE, including circuit switched fallback (CSFB), SMS over SGs, and voice over LTE (VoLTE). It includes background information on the standardization process, and the commercial implications for the different options. The white paper also addresses test and measurement requirements resulting from the support of voice and SMS in LTE.

Improving the accuracy of your microwave test and measurement equipment becomes increasingly important when high frequency devices are used in the transmission paths of radio, cellular, satellite and digital communications. This discussion helps to solve problems with measurement errors during and after calibration of your microwave test instrument.

A new family of ultra-reliable mixers, developed by Mini-Circuits, combines low-temperature cofired ceramic (LTCC) circuitry and specially selected semiconductor dice in a hermetically sealed case at 1/10th the price of comparable products on the market. Fully automated, tightly-controlled, and highly repeatable processes ensure excellent performance at temperatures up to 125 degrees C.

Rise/fall time is one of the key measurement parameters when designing, manufacturing or maintaining pulsed radar power amplifier systems, especially for wideband pulse power amplifiers. Learn how to achieve 5 nanosecond rise/fall time RF pulse measurement with Agilent Technologies 8990B peak power analyzer by reading this application note. This article also includes tips on how to consistently obtain accurate rise/fall time measurement results.