We use cookies to provide you with a better experience. By continuing to browse the site you are agreeing to our use of cookies in accordance with our Privacy Policy.
Pat Hindle is responsible for editorial content, article review and special industry reporting for Microwave Journal magazine and its web site in addition to social media and special digital projects. Prior to joining the Journal, Mr. Hindle held various technical and marketing positions throughout New England, including Marketing Communications Manager at M/A-COM (Tyco Electronics), Product/QA Manager at Alpha Industries (Skyworks), Program Manager at Raytheon and Project Manager/Quality Engineer at MIT. Mr. Hindle graduated from Northeastern University - Graduate School of Business Administration and holds a BS degree from Cornell University in Materials Science Engineering.
Cras justo nisl, porta vel tempus at, fringilla eu turpis! Fusce tincidunt sollicitudin ipsum, quis eleifend leo blandit eu. Quisque rutrum ante quis nulla gravida ut venenatis nunc fermentum. Ut et risus quam. Fusce dignissim arcu id lorem iaculis ultricies. Ut sed ante vel arcu suscipit egestas! Pellentesque vitae eros ipsum, vitae molestie nunc. Nam suscipit rhoncus libero vitae vestibulum? Nulla non metus nec nunc vestibulum luctus. Suspendisse venenatis est at elit bibendum pellentesque. Proin consequat suscipit neque, eu accumsan risus convallis eget. Nullam sed quam nec lectus blandit consectetur. Donec eu nisl sit amet neque posuere hendrerit. Curabitur non consectetur dolor.
This year's attendance seems pretty good but might end up being down some from previous shows excluding Hawaii. The technical attendance is reported at about 2400 through Wed. and about 9100 for the total attendance.