Test and Measurement Channel

Generating X-parameters from Circuit-level Designs

X-parameters represent a new category of nonlinear network parameters for high-frequency design and are used for characterizing the amplitudes and relative phase of harmonics generated by the nonlinear behavior of components. Developed and introduced by Agilent Technologies, X-parameters are applicable to both large-signal and small-signal conditions, and for linear and nonlinear components. They correctly characterize impedance mismatches and frequency mixing behavior to allow accurate simulation of cascaded nonlinear X-parameter blocks (e.g., amplifiers and mixers), in wireless design. X-parameters play a key role in the development of active devices like the power amplifier (PA) and mixers—critical components in today’s wireless designs.
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Understanding Long-Term Evolution Fundamentals and Measurement Challenges

The Universal Mobile Telecommunication System (UMTS), the successor to GSM, is steadily increasing its penetration of the world’s wireless communications markets, and is likely over time to become the primary standard used by not just the current 85% wireless carriers, but by virtually all of them. Its most promising emerging enhancement, Long-Term Evolution (LTE), has moved further along in the standards-setting process and on to the path of initial deployment.
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Rohde & Schwarz Touts EMI Test Receiver

Rohde & Schwarz , a market leader in EMC test and measurement, presents a new CISPR 16-1-1 compliant EMI test receiver for the frequency range from 9 kHz to 7 GHz. The R&S ESCI7 already meets the requirements of the current edition of the CISPR 22/EN 55022 standard for...
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China Telecom Selects Spirent Communications

Spirent Communications plc , a leader in wireless network, devices and applications testing, announced that China Telecom has selected the Spirent C2K-ATS system to test mobile phones before they are offered to its subscribers. China Telecom will use the Spirent test system for parametric radio testing, signaling conformance testing,...
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