Industry News

Keithley's Component Test Solution Combines Ease of Use with Curve Tracer Capabilities

Keithley Instruments Inc. , a leader in emerging measurement solutions, announced ACS Basic Edition, characterization and curve tracer software for component test applications. The latest addition to Keithley's powerful Automated Characterization Suite (ACS) family, ACS Basic Edition integrates with the industry's broadest range of source-measure units, Keithley's SourceMeter® Instrument...
Read More

Integer-N PLL Local Oscillator for Satellite Telecommand Receiver

This article describes the design and implementation of L-band frequency synthesizer based Local Oscillator to down-convert the uplink signal in a Telecommand Satellite Digital Receiver. An Integer-N PLL scheme was implemented to achieve a compact and low power module. The Local Oscillator when tested with the Receiver successfully achieved...
Read More

Advances in High-Performance Ceramic Antennas for Small-Form-Factor, Multi-Technology Devices

Two trends are well underway in portable and handheld consumer electronic devices: shrinking form factors and the integration of multiple wireless technologies, such as Bluetooth™, cellular, GPS and Wi-Fi. These trends create challenges for device vendors and integrators by increasing the likelihood of RF noise and other system interactions...
Read More

Then: Symposium On The Biological Effects And Health Implications Of Microwave Radiation

A Revival Of The Microwave-Biology Field?
In the ten years preceding the last Tri-Service Symposium (1960) on the “Biological Effects of Micro-waves,” a considerable community of researchers participated in the study of interaction of microwaves with biological systems, particularly animals and man. Military standards were confirmed at 10 mw/cm2 maximum permissible exposure levels based on...
Read More

SUSS Passes Probing Tests by US Manufacturer

SUSS MicroTec Test Systems has won a head-to-head evaluation with its PA300PS with ProbeShield® Technology, the 300 mm wafer-level probe system for device characterization and reliability test. As a result, the major US integrated device manufacturer (IDM) has named SUSS as its exclusive supplier of on-wafer characterization systems for...
Read More