Probe stations are a familiar tool in most RF measurement labs. On-wafer small-signal S-parameters and large-signal measurements are everyday tasks performed by technicians and engineers in research and development, design verification/validation testing and production testing. To successfully make on-wafer RF measurements, instrumentation, such as vector network analyzers (VNAs), must be connected to a device under test (DUT) through cable assemblies and RF probes. In addition, optional accessories such as attenuators, bias tees, couplers and filters may be needed depending on the application.
While often underappreciated, the cable assembly can be as important as the RF probe and must have appropriate electrical and mechanical characteristics to ensure accurate and repeatable on-wafer RF measurements. StabilityWafer™ microwave/RF cable assemblies have been designed specifically to achieve highly accurate and repeatable on-wafer small-signal S-parameters and large-signal measurements. These assemblies are optimized for size and weight and to fit on any probe station, with or without shielding enclosures. They are also highly flexible to minimize the pressure applied on the RF probes.
StabilityWafer cable assemblies have industry-leading phase and amplitude stability to ensure that the signal passing through the cables has minimal change as the RF probes move across a wafer. These assemblies are offered with standard male and female connectors, as well as with 90-degree right angle and extended ferules and 83-degree extended ferules. StabilityWafer assemblies are available up to 67 GHz (70 GHz extended performance) with 1.85 mm, 2.4 mm, 2.92 mm and 3.5 mm connectors. They are in stock in standard configurations and available for custom configurations.