Marvin Test Solutions’ GENASYS Semi is an advanced, open-architecture mmWave semiconductor test platform that delivers features and performance rivaling proprietary, “big iron” automatic test equipment (ATE) systems.

The GENASYS Semi TS-900e-5G series is the first production 5G mmWave semiconductor test solution capable of providing vector correlated, gap-free measurements across the frequency band to 53 GHz. Featuring Keysight’s PXIe VNA instrumentation and capable of supporting up to 20 independent, parallel measurement channels, the TS-900e-5G delivers exceptional measurement performance, repeatably and scalability.

Its modular, open platform architecture is flexible when faced with changing test needs, simplifying digital, analog and RF test resource expansion and updates. The compact design can be configured as a benchtop system or with an integrated manipulator without affecting measurement performance or system throughput. The high performance test interface delivers proven and repeatable connectivity to the device under test, with configurable receiver interface pin blocks so users can easily upgrade the receiver interface as test needs change or add new applications.

GENASYS Semi solutions are compatible with industry probe stations, device handlers (Opus 3, TEL, Seiko Epson E8040/ E8080) and manipulators (Reid-Ashman OM-1069, inTest). This simplifies integration into existing production facilities to meet the high throughput production demands of outsourced semiconductor assembly and test.

The ATEasy® Test Executive and Integrated Development Environment is included with all GENASYS Semi systems. It’s an easy-to-use software development environment with an integrated and customizable test executive for executing, sequencing, debugging and analyzing faults. It provides a full suite of digital and parametric test capabilities so users can quickly develop and maintain their test applications.

Marvin Test Solutions
Irvine, Calif.