The 101st ARFTG Microwave Measurement Conference is co-located with IMS2023. The theme for this conference is Challenges in Complex Measurement Environments.

The most important part of the ARFTG experience is the opportunity to interact with colleagues, experts and vendors of the RF and microwave test and measurement community.

ARFTG-101^st Conference focus topics: 

• On-wafer, over-the-air or hybrid measurements: methodologies, calibration approaches and related topics
• Calibration and uncertainty considerations in moving OTA measurements (robotics, stages, UAVs...)
• Nonlinear characterizations, incl. linearization, of devices, circuits, and systems
• De-embedding and calibration approaches for complex media
• Uncertainty topics in integrated system testing
• THz/mm-wave measurements, including with modulated signals
• Other developments in measurements and metrology

Topics of interest always include: RF/Digital mixed-signal measurement and calibration, nonlinear/large-signal measurement and modeling techniques, traceability in calibrations and measurement uncertainty, material properties characterization and applications and advances in vector network analysis.

There is always ample opportunity at every ARFTG conference for detailed technical discussions with others facing similar test and measurement challenges. The members of ARFTG often find that these interactions are their best source of ideas and information for their current projects. So come and join us at our next conference. You’ll find that the atmosphere is informal and friendly.