Sponsored Content Sponsored Content https://www.microwavejournal.com/rss en-us Join Wave 2018! Keysight is launching Wave 2018, a first-of-its kind event created to connect you with our experts. Plus, you can register for daily bench and RF giveaways worth more than $44,000! Keysight is launching Wave 2018, a first-of-its kind event created to connect you with our experts. Plus, you can register for daily bench and RF giveaways worth more than $44,000!

]]> http://www.microwavejournal.com/articles/29625 Fri, 12 Jan 2018 12:46:00 -0500 https://www.microwavejournal.com/articles/29625-join-wave-2018 Join Wave 2018! Keysight is launching Wave 2018, a first-of-its kind event created to connect you with our experts. Plus, you can register for daily bench and RF giveaways worth more than $44,000! Fundamentals of Building a Test System: System Maintenance In a perfect world, systems would never fail. Unfortunately, this is not reality—at least not yet. Systems fail and sudden, unexpected failures can be costly. Although you cannot completely remove the risk of failure, even with the most well-thought-out plans, you can reduce it. Ensure you have a maintenance strategy that can help you manage cost if something does go wrong and reduce the risk of failure. In a perfect world, systems would never fail. Unfortunately, this is not reality—at least not yet. Systems fail and sudden, unexpected failures can be costly. Although you cannot completely remove the risk of failure, even with the most well-thought-out plans, you can reduce it. Ensure you have a maintenance strategy that can help you manage cost if something does go wrong and reduce the risk of failure.

]]> http://www.microwavejournal.com/articles/29006 Thu, 07 Sep 2017 16:27:00 -0400 https://www.microwavejournal.com/articles/29006-fundamentals-of-building-a-test-system-system-maintenance NIwpLogo Register Now For EDI CON USA! Save 20% on Conference Pass with READ20MWJ September 11-13, Boston, MA Technical Papers, Workshops, Short Courses, Exhibits, & Speed Trainings Radar, T&M, IoT, Broadband, 5G, Autonomous Vehicle Design Save 20% on Conference Pass with READ20MWJ
  • September 11-13, Boston, MA
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  • Radar, T&M, IoT, Broadband, 5G, Autonomous Vehicle Design

    • Save 20% on Conference Pass with READ20MWJ

    ]]>     http://www.microwavejournal.com/articles/28761 Tue, 18 Jul 2017 21:10:00 -0400 https://www.microwavejournal.com/articles/28761-register-now-for-edi-con-usa EDICONUSA_sponsoredConted_Logo     University of Bristol and Lund University Partner to Set World Records in 5G Wireless Spectral Efficiency To address our rapidly approaching, hyper-connected future and the unprecedented demand on current 4G wireless networks, researchers at the University of Bristol and Lund University set out to test the feasibility of massive MIMO as a viable technology for 5G networks. Using the NI MIMO Prototyping System, the team was able to rapidly test new ideas on their way to implementing the world’s first live demonstration of a 128-antenna, real-time massive MIMO testbed and set two consecutive world records in spectral efficiency. To address our rapidly approaching, hyper-connected future and the unprecedented demand on current 4G wireless networks, researchers at the University of Bristol and Lund University set out to test the feasibility of massive MIMO as a viable technology for 5G networks. Using the NI MIMO Prototyping System, the team was able to rapidly test new ideas on their way to implementing the world’s first live demonstration of a 128-antenna, real-time massive MIMO testbed and set two consecutive world records in spectral efficiency.

    ]]>     http://www.microwavejournal.com/articles/28190 Fri, 14 Apr 2017 10:05:00 -0400 https://www.microwavejournal.com/articles/28190-university-of-bristol-and-lund-university-partner-to-set-world-records-in-5g-wireless-spectral-efficiency NIwpLogo     Bridging the Gap between RF Front-End Module Characterization and Production Test with the Semiconductor Test System With the modern mobile device revolution, semiconductor suppliers are challenged to increase capability, integration, and performance while reducing time to market. Test needs a new approach based on an open, flexible platform at significantly lower cost. NI is bridging this gap by building on the stability and capability of the PXI platform to deliver off-the-shelf modular technology to both the characterization and production engineer. http://www.microwavejournal.com/articles/28133 Tue, 04 Apr 2017 13:53:00 -0400 https://www.microwavejournal.com/articles/28133-bridging-the-gap-between-rf-front-end-module-characterization-and-production-test-with-the-semiconductor-test-system NI STS