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MM5600 and High-Speed Digital Loopback Testing


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1/26/23 11:00 am to 12:00 pm EST

Event Description

Technical Education Webinar Series

Title: MM5600 and High-Speed Digital Loopback Testing

Date: January 26, 2023

Sponsored by: RFMW and Menlo Microwave

Presented by: Stewart Yang, Applications Engineer, Menlo Micro

Increased network speeds are calling for faster memory and serial bus communications between chipsets. Due to high-speed precision testing of chipsets on design-in boards, test engineers are being pushed to utilize higher precision components on loopback paths with switches to route the signals back into the DUT. Many of these paths include PCIe 4.0/5.0, Serdes, Ethernet, USB3.x/4, and HDMI. Increasing data rates for paths such as PCIe 5.0 can be problematic due to limitations of switch performance at higher frequencies. The lifespan of a MEMS switch is 3 billion cycles with switching speeds of 10us, compared to up to 10 million life cycles for EM relays with millisecond switching speeds. Signal integrity is needed for optimized PCB layout and fabrication. This session will cover fixture design, PCB design parameters, and how to minimize impedance discontinuity. We will review differential signaling scheme, eye diagram test setup and test conditions, and measured eye-diagram performance vs. simulation results. Combining a PCIe 5.0 loopback with differential DPDT MEMS switches delivers optimal eye height and eye width without enabling pre-emphasis or equalization.

Presenter Bio:

Stewart Yang as part of Menlo's Application Engineering team, Stewart has played an integral role in supporting leading customer designs and assisting them with their product development. Stewart has extensive engineering experience working in the semiconductor industry supporting major global accounts, with expertise at the device level supporting xDSL, 802.11, microwave backhaul, and satellite front-end. Stewart has a Bachelor’s Degree in Electrical Engineering from Hanyang University in South Korea.

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