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Digital Component Accelerated Life Testing With RF


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8/10/22 11:00 am to 12:00 pm EDT

Event Description


Technical Education Webinar Series

Title: Digital Component Accelerated Life Testing With RF

Date: August 10, 2022

Time: 8am PT /11am ET

Sponsored by: AR

Presented by: Dean Landers, Supervisor, Applications Engineering, AR


Wireless front-end components are potentially subjected to high-stress levels. Because of this, operational RF drive levels and currents exacerbate the potential for failure. Additionally, connection to an antenna permits to ingress of external energy. Manufacturing variance and defect can contribute to the possible life span. These aspects require specialized testing to capture both early failures and long-term wear-out. This presentation will consider the parameters and equipment necessary to accurately specify Mean Time to Failure (MTTF) and capture Early Failure Rate (EFR).

Presenter Bio:

Dean Landers is the Supervisor of Applications Engineering for AR RF/Microwave Instrumentation.  He is actively engaged in new application and product development, system development and integration, customer support, and training with hardware demonstrations for both customers and AR personnel.  Prior to working at Amplifier Research, Dean spent 9 years as an EMC Test Engineer at Retlif Testing Laboratories, managing military, commercial aviation, and commercial test programs, writing customer test procedures, and working with customers to help them understand their compliance needs and requirements.  He also serves on the IEEE EMC Society Executive Committee and is the current chair.

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