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Modular VNA Architectures – Closing the Distance Between DUT and VNA

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When

9/23/20 11:00 am to 9/23/20 12:00 pm EST

Event Description

Technical Education Webinar Series

Title: Modular VNA Architectures – Closing the Distance Between DUT and VNA

Date: September 23, 2020

Time: 8am PT / 11am ET

Sponsored by: Anritsu Company

Presented by: Stanley Oda, Sr. Product Manager, ShockLine VNAs

Abstract:
S-parameter measurement over distance in applications like over-the-air testing, large vehicle electromagnetic characterization, and insertion loss measurements on installed long distance cable runs becomes increasingly complicated as frequencies increase into the millimeter-wave (mmWave) region. At these frequencies using coax cabling to interface the DUT to a standard VNA becomes problematic because of the insertion loss and phase instability of coax cabling over long distances. To overcome these issues, high-performance VNAs, active signal conditioning hardware, and other components must be added to the typical test setup.

This webinar will discuss a new approach and methodology to making these distance measurements. You will learn more about the critical benefits of leveraging modular VNAs at higher frequencies to minimize distances between the DUT and the VNA port to make stable, repeatable measurements.

Who should attend:
Engineers, test engineers, and manufacturing who are conducting outdoor antenna range testing, OTA chamber installations, large vehicle (aircraft, ship) electromagnetic characterization (shielding, RF propagation), and long distance cable insertion loss measurements.

What you will learn:

  • Example applications for long-distance VNA S-parameter measurements
  • Existing setups using high-performance VNAs and additional components to overcome distance related measurement issues
  • Disadvantages of current solutions and a different technological approach to overcoming these limitations
  • A new modular VNA solution to S-parameter measurements over distances of 100+ meters

Presenter Bio:

Stan Oda is the Sr. Product Manager for ShockLine family of Vector Network Analyzers at Anritsu Company. He has held various roles from Applications Engineer to Business Development Specialist during his over 30 years in the Test and Measurement industry. Stan earned his BSEE degree from the Massachusetts Institute of Technology.

Please note:
By registering for this webinar, the details of your profile may be used by Microwave Journal®, the presenter and the sponsor to contact you by email.

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