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EDI CON Online: WiFi 6E Chipset Characterization

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When

10/6/20 11:00 am to 10/6/20 11:30 am EST

Event Description

EDI CON Online

Title: WiFi 6E Chipset Characterization

Date: October 6, 2020

Time: 8:00am PT / 11:00am ET

Sponsored by: Boonton

Presented by: Walt Strickler, VP & General Manager

Abstract:
Characterization and compliance testing of Wi-Fi chipsets and devices using them involves significant challenges for design and test engineers. With multiple-input, multiple-output (MIMO) architectures and channel bandwidths up to 160 MHz, testing is complex and demands on test equipment often require compromises when measuring RF power per channel and time alignment between channels. Learn how to conduct these tests without compromise with intuitive, high-performance, and cost-effective instruments.

Presenter Bio:

Walt Strickler is VP and General Manager of Boonton Electronics, a wholly-owned subsidiary of the Wireless Telecom Group. He is a seasoned veteran of the test and measurement industry with previous experience at Anritsu, Giga-tronics, Bird Technologies, and Keithley Instruments. Prior to that, Walt worked at the NASA Glenn Research Center focused on microwave communications. Walt has a BSEE and an MBA.

Please note:
To register for other EDI CON Online signal integrity, power integrity and EMC/EMI related events, please visit the Signal Integrity Journal website.

By registering, you are agreeing to allow the data collected to be shared with Microwave Journal®, Signal Integrity Journal™, the speakers & the sponsors of this event. You may be contacted regarding the subject matter presented.

 

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