EDI CON Online
Title: WiFi 6E Chipset Characterization
Date: October 6, 2020
Time: 8:00am PT / 11:00am ET
Sponsored by: Boonton
Presented by: Walt Strickler, VP & General Manager
Characterization and compliance testing of Wi-Fi chipsets and devices using them involves significant challenges for design and test engineers. With multiple-input, multiple-output (MIMO) architectures and channel bandwidths up to 160 MHz, testing is complex and demands on test equipment often require compromises when measuring RF power per channel and time alignment between channels. Learn how to conduct these tests without compromise with intuitive, high-performance, and cost-effective instruments.
Walt Strickler is VP and General Manager of Boonton Electronics, a wholly-owned subsidiary of the Wireless Telecom Group. He is a seasoned veteran of the test and measurement industry with previous experience at Anritsu, Giga-tronics, Bird Technologies, and Keithley Instruments. Prior to that, Walt worked at the NASA Glenn Research Center focused on microwave communications. Walt has a BSEE and an MBA.
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