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Optimizing Peak-to-Average Power Ratio for Wireless Systems

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When

5/6/20 11:00 am to 5/6/20 12:00 pm EST

Event Description

Technical Education Webinar Series

Title: Optimizing Peak-to-Average Power Ratio for Wireless Systems

Date: May 6, 2020

Time: 8am PT / 11am ET

Sponsored by: Tabor Electronics and Boonton Electronics

Presented by: Mark Elo, US General Manager, Tabor Electronics USA and Walt Strickler, VP and General Manager of Boonton Electronics

Abstract:
The signals used in today’s most advanced communication technologies can employ various modulation and multiplexing techniques to optimize different parameters, such as spectral efficiency, susceptibility to interference, and data rate. Correspondingly, these signals can have widely varying peak-to-average power ratios (PAPRs). Careful consideration must be taken with regard to PAPR. If it is too high, it can lead to spectral spreading or regrowth. However, lowering power can lead to less efficient operation of critical components like power amplifiers. This webinar will explain how to use advanced arbitrary waveform generators to create signals with varying PAPRs and how to simply and cost-effectively measure PAPR utilizing RF peak power sensors throughout an RF transmission chain to make trade-offs for optimal system performance.

Presenter Bios:

Mr. Walt Strickler is VP and General Manager of Boonton Electronics, a wholly-owned subsidiary of the Wireless Telecom Group. He is a seasoned veteran of the test and measurement industry with previous experience at Anritsu, Giga-tronics, Bird Technologies, and Keithley Instruments. Prior to that, Walt worked at the NASA Glenn Research Center focused on microwave communications. Walt has a BSEE and an MBA.

Mr. Mark Elo is the US General Manager for Tabor Electronics USA. He began his career as a design engineer in Hewlett-Packard's Microwave Division and has since held various senior positions at Agilent Technologies, Anritsu, Gigatronics and Keithley Instruments in R&D, marketing and business development. Mr. Elo has more than 30 years of test and measurement experience in microwave instrumentation, specializing in the product definition and product realization of RF and microwave frequency synthesis and analysis platforms.

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