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David Vye, MWJ Editor
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David Vye is responsible for Microwave Journal's editorial content, article review and special industry reporting. Prior to joining the Journal, Mr. Vye was a product-marketing manager with Ansoft Corporation, responsible for high frequency circuit/system design tools and technical marketing communications. He previously worked for Raytheon Research Division and Advanced Device Center as a Sr. Design Engineer, responsible for PHEMT, HBT and MESFET characterization and modeling as well as MMIC design and test. David also worked at M/A-COM's Advanced Semiconductor Operations developing automated test systems and active device modeling methods for GaAs FETs. He is a 1984 graduate of the University of Massachusetts at Dartmouth, with a concentration in microwave engineering.

Recent Comments

The truth will come out in 2069.Some patience...

obviously they used alien technology duh...

The problems created by the weak nuclear bond...

John

Skylines

More Fun with MM-Wave Body Imaging

November 24, 2010
David Vye
No Comments
Thanks to the “don’t touch my junk” traveler, most of the public is now aware of the controversy over the body imaging technology being employed at various airports (65 as of October 2010). Two types of body imaging technologies are actually employed. The first one known as Backscatter X-ray is an advanced imaging technology that detects the radiation that reflected from the target. . Traditional X-ray machines detect hard and soft materials by the variation in transmission through the target. A competing technology is millimeter wave scanner which produces a 3D image whereas the backscatter x-ray 2D image. The...
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and the winner is....

November 16, 2010
David Vye
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The Global Semiconductor Association (GSA) just announced its 2010 Award Nominees for the Annual Awards Dinner Celebration and there are a few familiar RF/Microwave semiconductor vendors among the list of companies being honored at the gala happening on December 9th in San Jose. - SiGe Semiconductor, Inc. was nominated for the Most Respected Private Semiconductor Company award - Broadcom Corporation was nominated for the Most Respected Public Semiconductor Company award nominees achieving $500 million to $10 billion in annual sales - Hittite Microwave Corporation and QUALCOMM CDMA Technologies were nominated for the Best Financially Managed Semiconductor Company award - In...
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FAQs - 4G and Future Directions in Cellular Wireless Standards

November 2, 2010
David Vye
No Comments
Courtesy of TriQuint Semiconductor Q: What is 4G and where does it fit in the development of cellular communication standards? A: 4G refers to the Fourth Generation of cellular wireless standards. The First Generation (1G) of cellular wireless supported analog mobile phones. This transitioned to Second Generation (2G) digital service, which offered a significant upgrade in capabilities. The Third Generation (3G) supports multi-media, spread-spectrum transmission with larger volumes of data transfer and improved speeds. It enables numerous applications including e-mail and web browsing. Fourth Generation (4G) takes the capabilities of wireless a step further. 4G increases bandwidth and modulation complexity...
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‘Wireless’ humans could form backbone of new mobile networks

October 28, 2010
David Vye
No Comments
Members of the public could form the backbone of powerful new mobile internet networks by carrying wearable sensors. According to researchers from Queen’s University Belfast, the novel sensors could create new ultra high bandwidth mobile internet infrastructures and reduce the density of mobile phone base stations. The engineers from Queen’s renowned Institute of Electronics, Communications and Information Technology (ECIT), are working on a new project based on the rapidly developing science of body centric communications. Social benefits from the work could include vast improvements in mobile gaming and remote healthcare, along with new precision monitoring of athletes and real-time tactical...
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A Look at Antenna Tower Field Repair

October 15, 2010
David Vye
One Comment
If you think working in an office or a lab is tough, imagine repairing equipment on top of an antenna tower at over 1,700 feet. This video is making its way around facebook and is certainly not for people who are afraid of heights. As impressive as the hardware is, operating outdoors under extreme environmental conditions, I must express equal respect for the linemen who service these towers. Test and measurement vendors have been producing a number of handheld instruments designed to make their jobs easier and safer. I just can't imagine operating a VNA or spectrum analyzer from...
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Addressing Smartphone Interference with your Alarm Clock

October 13, 2010
David Vye
No Comments
It happens in my house late and night or early in the morning, when I forget to turn off my Blackberry and the stream of incoming e-mail spams lead to pick-up with the audio portion of my clock radio, setting off an annoying buzz. It is highly likely that most of us have been in meetings, on conference calls or even watching television and have been victims of “the buzz” - that awful annoying feedback emitted from mobile devices when they are in close proximity to audio devices. That annoying buzz occurs when an electrical audio device amplifies a cell...
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EuMW Exhibition 2010: from A to Z

October 3, 2010
David Vye
No Comments
A is for agnostic nonlinear model support, the leading news from AWR in support of the Cardiff models, the latest S-functions from NMDG and X-parameters from Agilent B is for broadband time delays product line from Hittite , a DC to 24 GHz analog time delay that supports data transmission to 32 Gbps or clock signal delay up to 24 GHz. C is for cross correlation Phase Noise analyzers from Holzworth for either fixed or tunable DUT test frequencies. D is for distortion, an increasing concern highlighted by the importance of IM levels and a driving factor behind Creowave’s...
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EuMW 2010 Exhibition Report: The lay of the land

October 2, 2010
David Vye
One Comment
European Microwave Week was held in the CNIT convention center in the newer business center that lies to the west of the city’s center, a straight shot down Rue Charles de Galle, about three and a half miles from the Arc de Triomphe. The Center of New Industries and Technologies, or CNIT, is one of the first buildings to ever be constructed in La Défense, Paris. It is a palace for the French Congress that houses the main offices and also functions as a convenience store for the congressmen and their visitors. The initial construction of CNIT was completed...
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TriQuint's New 0.15um PHEMT Unveiled at EumW

September 28, 2010
David Vye
No Comments
Last evening I attended TriQuint’s customer presentation on their new TQP15 process, which was conveniently held at the hotel where I am staying. Enjoying the relaxed atmosphere, wine and canapés were two dozen or so representatives of MMIC design houses such as Plextek and Roke Manor, journalist, investors and other interested parties. Following the meet and greet with various TriQuint foundry management and marketing folks, the event centered around a presentation by Corey Nevers and Ed Knapp on the technical aspects and targeted applications of the new process. This presentation was followed by an informative Q&A session with attendees. TQP15...
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EumW Conference Starts, Exhibition Set-up for Tuesday Opening

September 27, 2010
David Vye
No Comments
Delegates were busy registering and attending the Monday sessions today as work crews unpacked displays and began building the stands for the 2010 exhibition. By mid-morning set-ups were progressing without much drama, in anticipation of the Tuesday opening. Since there are an impressive number of European Microwave companies engaged in nonlinear device characterization and the development of related test systems, it is appropriate that the European Microwave Week exhibition will feature a sizable representation of companies offering load-pull and related test solutions. Several of these companies were mentioned in last March’s cover story on non-linear Characterization and device modeling including...
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