Microwave Journal

Cascade Offers Fully Integrated Flicker Noise Measurement System

July 2, 2008

With the cost of developing each new semiconductor manufacturing process node escalating dramatically and time to market pressures increasing, there is no longer room for error in measuring critical parameters such as flicker noise. Recognizing these market realities and their impact on semiconductor manufacturers, Cascade Microtech has introduced the EDGE Flicker Noise Measurement System, the only flicker noise measurement system that is certified to provide accurate measurements from 1 Hz to 30 MHz.

In addition, the EDGE Flicker Noise Measurement System is the industry's only fully integrated measurement system. In contrast to traditional flicker noise measurement solutions, which are bolted-together systems comprising system elements from up to five different vendors, the EDGE Flicker Noise Measurement System is a true turn-key solution. Seamless integration of the wafer probe station, instruments, software and accessories is overlaid with unprecedented service and support in the form of site surveys, pre- and post-measurement optimization and continuing application support. The result is a worry-free, accurate flicker noise measurement.

"Flicker noise is a particularly intricate parameter to characterize. Having worked closely with Cascade Microtech on the first deployment of its EDGE Flicker Noise Measurement system, we can have confidence in the measurements this system produces," said Michael Cheng, senior director, device technology division at Chartered Semiconductor Manufacturing. "This enables us to provide our customers with substantially more information on the devices' flicker noise performance, which is critical in the design of low-noise, high-performance circuits."