Microwave Journal
EuMW2019 episode

Frequency Matters, Oct 3, 2019: EuMW 2019 review plus interview with NI/AWR & UMS

RF and microwave video update series

October 11, 2019

Microwave Journal editors Pat Hindle and Gary Lerude review EuMW products at the event and talk with David Vye of NI/AWR & Eric LeClerc of UMS about their collaboration on GaN device modeling/simulation.

Sponsored by:
NI/AWR logo



View other episodes at http://videos.microwavejournal.com/pages/frequency-matters.