Microwave Journal
www.microwavejournal.com/articles/29191-mpi-corporation-installs-next-generation-thz-probe-system-at-chalmers-university

MPI Corporation Installs Next-Generation THZ Probe System at Chalmers University

October 6, 2017

MPI Corporation has successfully installed the next-generation THZ probe system at the Kollberg Laboratory at Chalmers University of Technology, a leading research university located in Gothenburg, Sweden, to develop new measurement solutions for wafer-level characterization at THz frequency range.

The Kollberg laboratory, an established infrastructure for terahertz characterization, now has superior capabilities for wafer-level electrical measurements, research on new materials, devices and circuits for sub-millimeter wave frequency applications thanks to unique features of the new TS150-THZ probe system.

The TS150-THZ integrated wafer probe system from MPI Corporation was specifically designed for probing at THz frequencies incorporating innovative features to include seamless integration of vector network analyzer (VNA) frequency extenders of any type and frequency bands up to 1.7 THz.

The TS150-THZ is claimed to provide the maximum possible measurement dynamic range and highest accuracy of measurement results. With new features such as Probe Hover Control, Chuck Auto-Lock and Auto-Contact the new system significantly increases reproducibility of system calibration and measurement data and extends the lifetime of expensive THz accessories.

“As the renowned innovation leader in the field of wafer-level measurements, we are proud to deliver such a unique system to the world-class Chalmers’ THz researchers,” said Dr. Andrej Rumiantsev, Director of RF Technologies of AST Division at MPI. “As the application technology reaches THz frequency, we will continue pushing wafer-level measurement limits with Chalmers’ researchers.”