Anritsu completes testing of GCT Semiconductor's LTE-Advanced single chip
Anritsu Co. announces it successfully completed testing of GCT Semiconductor’s 4G LTE-Advanced chip, GDM7243Q, using Anritsu’s MD8430A signaling tester with Rapid Test Designer (RTD). GCT Semiconductor, a leading designer and supplier of advanced 4G mobile semiconductor solutions, offers an advanced FDD-TDD LTE Category 5/6/7 single chip, with the world’s first 4X4 MIMO carrier aggregation for LTE. GDM7243Q’s operation and 4X4 MIMO capabilities have been tested on Anritsu’s signaling testing system.
4x4 Multiple Input Multiple Output (MIMO) involves the use of four transmit antennas at the LTE base station, and four receiver antennas inside the user equipment (UE) device, in order to increase spectral efficiency, achieve higher data throughout and improve coverage. Anritsu’s MD8430A is an LTE signaling tester that can simulate a base station with up to eight transmit antennas. The engineering team at GCT used the MD8430A controlled by RTD software to transmit at up to 300 Mbps over a 4x4 MIMO connection, and were able to verify that their chip could reliably sustain the connection over an extended period of time.
“We depend on Anritsu equipment to test our LTE-Advanced chip,” said Dr. Jeong-Min Kim, CTO and vice president of Engineering at GCT Semiconductor. “Anritsu’s MD8430A and RTD solution has proven to be a robust platform, supporting critical features such as 4x4 MIMO,” he added.
“Anritsu is pleased that GCT Semiconductor has used the MD8430A with RTD to verify its 4x4 MIMO capability,” stated Kenji Tanaka, executive vice president at Anritsu. “This activity shows how Anritsu continues to help LTE device makers prove their leading-edge technology in an intensely competitive market where reducing the product launch cycle time is critical to success.”