Agilent application note: Increase phased array antenna test throughput with Agilent digitizer
What: This application note addresses test challenges faced by phased array antenna engineers including:
- The need for fast wideband, high resolution sampling of IF signals post downconversion.
- The need to achieve phase coherent sampling across all input channels, providing relative magnitude and phase measurements.
- The need to make different trade-offs between sensitivity and analysis bandwidth per the test scenario.
When: Available now
Where: The application note can be downloaded at: http://cp.literature.agilent.com/litweb/pdf/5991-1351EN.pdf
Additional Information: www.agilent.com/find/M9703A