Articles Tagged with ''manufacturing''

Mentor Graphics announces Open Manufacturing Language standard for PCB assembly

Mentor Graphics Corp. announced the launch of the Open Manufacturing Language (OML) initiative that directly addresses the longstanding need and urgent calls from the industry for a printed circuit board (PCB) assembly-specific Internet of Manufacturing solution. For the first time, IT teams, solution providers, and equipment providers can easily integrate shop-floor data to create or enhance added-value manufacturing execution solutions based on a single, normalized, vendor-neutral communication interface.


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MACOM SPAR tiles selected as testbed for DARPA ACT radar program

M/A-COM Technology Solutions Holdings Inc., a leading supplier of high-performance analog RF, microwave, millimeterwave, and photonic semiconductor products, announced that its Scalable Planar ARray (SPAR) Tile technology has been selected by Massachusetts Institute of Technology’s Lincoln Laboratory (MIT LL) for use in a test bed for the U.S Defense Advanced Research Projects Agency’s (DARPA) Arrays at Commercial Timescale (ACT) program.


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Soitec and Simgui announce first 200-MM SOI wafers produced in China

Soitec (Euronext), a world leader in generating and manufacturing semiconductor materials for the electronics and energy industries, and Shanghai Simgui Technology Co., Ltd. (Simgui), a leading Chinese silicon-based semiconductor materials company, jointly announced that the first 200-mm silicon-on-insulator (SOI) wafers have been produced at Simgui’s manufacturing facility in Shanghai using Soitec’s proprietary Smart Cut™ technology, and will be shipped within the next weeks for customer’s qualification.


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NI drives down cost of wireless production test

NI, the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, released the Wireless Test System (WTS), a solution that dramatically lowers the cost of high-volume wireless manufacturing test. Although faced with the rising complexity of wireless test, companies can confidently reduce test costs and multiply throughput on the production floor with a system optimized for measurement speed and parallel test.


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