Articles Tagged with ''design''

Smiths_PR_Volta

Volta Series Probe

Smiths Interconnect announces the release of the Volta Series probe heads optimized for wafer level chip scale package testing. Volta is used for testing the chips (while in their wafer form) that are behind everything from Bluetooth and power management to digital display controllers. Volta helps customers deliver higher quality products by ensuring the chips in them are up to specification, and perform as they should.


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NI AWR Software Featured at EDI CON 2017 in Booth Demonstrations and at Workshop/Technical Sessions

The latest release of NI AWR Design Environment, V13, will be on display at the Electronic Design Innovation Conference (EDI CON) 2017, being held
in Shanghai, China on April 25-27. In addition to software demonstrations within NI Booth #311, the NI AWR software product portfolio will be featured in one 40-minute workshop and two 20-minute technical sessions. NI AWR software activities during EDI CON include:


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Keysight Technologies’ New Ready-to-Teach IoT Applied Courseware Provides Students with Real-World Experiences

The Keysight U3800 Series Internet of Things (IoT) applied courseware includes ready-to-teach materials focused on practical IoT design and test techniques. The courseware was developed as a resource for educators with a goal of ensuring students are well-prepared to meet the challenges of today's IoT industry.


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efabless Unveils Online Community to Reimagine Chip Design

efabless Corp., an open-innovation, hardware creation platform,  became the first online marketplace for community-developed, customized intellectual property (IP) and integrated circuits (ICs), allowing hardware system innovators to turn ideas into marketable products. Initially focused on analog and mixed-signal design for customized ICs, efabless addresses all of the steps required to cost effectively take an electronics specification to prototype.


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EDI CON USA Announces 2017 Event: Save the Date!

Bringing together engineers working in RF/microwave with those working in high-speed digital, EDI CON USA offers an opportunity to learn from other disciplines and transfer techniques and methods between applications. The exhibit floor will include booths from industry-leading companies working in both of these areas, as well as feature the SI ZONE, a specialized demo area for signal integrity, power integrity and EMI/EMC products. 


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