January 28, 2009
What: Mike Resso, Signal Integrity Application Scientist from Agilent's Component Test Division has co-authored "Signal Integrity Characterization Techniques", together with Dr. Eric Bogatin, Signal Integrity Evangelist, President, Bogatin Enterprises, LLC.
The book addresses the gap between traditional digital and microwave curricula all while focusing on a practical and intuitive understanding of signal integrity effects within the data transmission channel and focuses on real-world applications of signal integrity measurements-from backplane for design challenges to error correction techniques to jitter measurement technologies. It addresses some of these new high-speed technologies, and it also provides valuable insight into its future direction and will teach the reader valuable lessons on the industry.
When: The book is on schedule to have printed copies available at DesignCon, Santa Clara, Convention Center, February 2 - 5, 2009. The Agilent booth number is 305.
Where: The book is published by the International Engineering Consortium (IEC), ISBN: 1-931695-93-8 and will be available for purchase at DesignCon 2009 and through a number of reseller agreements for IEC Publications.
For more information please click here.
