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Test and Measurement Channel

Test and Measurement related topics

ARTICLES

Optimal+ announces big data analytics support for NI semiconductor test system

Optimal+, a global big data analytics provider for the semiconductor industry, announced that it has collaborated with NI, a leading provider of platform-based test systems that enable engineers and scientists to solve the world’s greatest engineering challenges, so that the entire suite of solutions from Optimal+ will be supported by NI’s Semiconductor Test System (STS) via the Optimal+ Proxy starting in Q1 2016.


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Keysight's new X-Series signal analyzers provide significantly enhanced capabilities

Keysight Technologies, Inc. announced new X-Series signal analyzers that provide significantly enhanced capabilities for developers creating next-generation devices. Most notable is a multi-touch user interface (UI) that streamlines measurement setup and creates a solid foundation for new solutions. Performance improvements and feature enhancements address emerging needs in aerospace, defense and wireless communications.


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Keysight’s new user experience builds on tradition of unsurpassed quality, craftsmanship

Keysight Technologies, Inc. announced the new design of Keysight products built on a platform of exceptional user experience, with advances in multi-touch user interface and an environmentally responsible build and re-use model. The contemporary, new look complements the company’s uncompromised history of quality and craftsmanship.


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Tektronix unveils new logo, brand strategy

Tektronix, Inc., a leading worldwide provider of measurement solutions, launched a new logo and brand strategy, marking the most significant change in its visual identity in 24 years. Founded in 1946, Tektronix is one of the most iconic companies in the electronics industry. On the eve of the company’s 70th anniversary, the refreshed logo pays homage to this herita


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NI Automated Test Outlook reinforces need for smarter test systems

NI announced the release of its Automated Test Outlook 2016. The annual test and measurement report delivers a comprehensive view of the key trends expected to impact automated test environments with the proliferation of connected devices, from preparing to test mmWave communication to effectively using manufacturing test data to propel business results.


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Keysight’s low-frequency noise measurement system adopted by China CEPREI Lab

Keysight Technologies, Inc. announced that CEPREI Laboratory has successfully adopted the Keysight EEsof EDA E4727A Advanced Low-Frequency Noise Analyzer(A-LFNA) for measurement and analysis of flicker noise (1/f noise) and random telegraph noise (RTN) during its reliability studies of semiconductor devices including MOSFETs, HEMTs and TFTs.


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NSI and MI Technologies announce merger

Quadrant Management’s Ted Deinard announced that it has acquired MI Technologies LLC (MI) and will merge MI with its portfolio company NSI, joining the two premier microwave measurement companies into a single entity. This merger allows the companies to combine their resources to bring quality, cost effective products and systems to their customers.


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IMAGE GALLERIES

Autotestcon 2013

Schaumburg, IL

EVENTS

Webinars

Millimeter Wave and E-Band Vector Network Analyzer Solutions

3/2/16


Technical Education Webinar Series

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DOCUMENTS AND FILES

Integration and Operational Guidelines for MEMS-Based Inertial Systems: Applications that Include Magnetometers

High-performance inertial systems provide accurate platform heading information in a variety of applications and operational environments. However, the magnetometers used are susceptible to measurement distortion in the presence of any magnetic material. This white paper documents product integration and on-board calibration procedures that mitigate distortion and optimize overall product performance.

RF Measurements Application Note

Modern modular digitizers, like the Spectrum M4i series PCIe digitizers, offer greater bandwidth and higher resolution at any given bandwidth than ever before. Although they are in the class of general purpose measuring instruments they are capable of many RF and lower microwave frequency measurements. This article focuses on some examples of common RF measurements that can be performed with these modular digitizers.

IMD Measurements with IMDView MS4640B Series Vector Network Analyzer

Intermodulation distortion (IMD) is an important consideration in microwave and RF component design. A common technique for testing IMD is the use of two tones. Two-tone testing for IMD has been used to characterize the non-linearity of microwave and RF components, both active and passive, for a very long time. Traditionally, this has been done at fixed frequencies using multiple signal generators, a combiner, and a spectrum analyzer. Because IMD varies with frequency, these measurements must be repeated at various frequencies to get a clear picture of what a deviceâ??s true behavior is across its specified operating range. This can be a time consuming process using the traditional signal generators and spectrum analyzers. The Anritsu VectorStar MS4640B Series Vector Network Analyzers can be used to quickly and accurately make S parameter, gain compression, fixed and swept frequency IMD measurements using a single cable connection to the DUT.

Speed Time to Market with Consistent Measurements from R&D Through Manufacturing

When multiple instrument form factors such as benchtop and PXI instruments are used in your design and manufacturing processes the challenge is to achieve reliably consistent measurement results while using the best instrument for a specific purpose. This application note provides a no-sacrifice-required solution for achieving consistent measurement results that correlate across instrument types, throughout the product development cycle.

New Pulse Analysis Techniques for Radar and EW

Pulse signals are widespread in radar and other EW applications and must be accurately measured for manufacturing, design of countermeasures, and threat assessment. However, pulse measurements are an especially challenging area for signal analysis due to a combination of factors such as wide pulse bandwidth, pulses that are difficult to detect, and increasingly complex signal environments. This application note discusses the best tools for different types of pulse analysis, along with display and analysis techniques for various signals and measurement goals.

How to Select an Analog Signal Generator

Today's microwave and wireless communications market is expanding at an incredible rate, thus increasing the need for test equipment that will help verify the performance of devices and systems. A flexible tool for a broad scope of applications is the signal generator because of its wide frequency range, high output power and variety of modulations. For example, signal generators with a minimum frequency of 9 kHz permit applications in EMC measurements. Frequency coverage up to 12.75 GHz covers ISM bands as well as all important mobile radio bands. Microwave signal generators may cover or support frequencies up to 20 GHz, 40 GHz and even 110 GHz.

7 Tips for Selecting Modular Test Equipment for Wireless Applications

Many multifunction devices require wider bandwidths, complex modulation schemes and multiple transmit and receive chains, which significantly increases device complexity and test expense. This application note provides useful tips on how to select the right test instruments which enable you to reduce design time, increase production throughput, and ultimately reduce your costs associated with test.

Modern Vector Network Analyzer Test Solutions Improve On-Wafer Measurement Efficiency

Semiconductor manufacturing test engineers face challenges related to broadband millimeter wave (MMW) on-wafer testing. Achieving accurate, stable measurements, typically performed using VNAs, over extended time periods is a challenge for foundries and fab-less semiconductor companies that require extensive on-wafer devices testing. This paper examines the impact of calibration downtime during on-wafer testing and recent advances enabling longer time periods between calibrations.

A Simple Approach to Signal Via Stubs for Coaxial PCB Connector Launches

When designing printed circuit boards launches for coaxial test connectors, there are a number of aspects to consider in order to get the clearest picture of the intended device under test. Learn a relatively simple approach to modeling back-drilled vias and a rough "rule of thumb" to modeling them without electrical modeling tools.

Build Applications Tailored for Remote Signal Monitoring with the Signal Hound BB60C

The Signal Hound BB60C operates and is powered by connecting to a host PC through a USB 3.0 cable. Remote spectrum analyzer and PC management tasks are accomplished over an Ethernet connection through the use of a low cost Intel vPro- enabled PC, such as the Intel NUC, model DC53427HYE, paired with each BB60C. Intel's vPro technology keeps the Ethernet port powered on, even when the Core i5 processor is turned off, so that it can always receive commands.

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