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Test and Measurement Channel

Test and Measurement related topics


Anritsu solution reduces cost of field testing

Anritsu Co. introduces a CPRI RF Measurement option for its BTS Master™ handheld base station analyzer family that can significantly reduce the operational expense (OpEx) associated with troubleshooting interference at base stations. Featuring best-in-class sweep speed and unique test capabilities, the BTS Master-based CPRI RF measurement test set allows field engineers and technicians to conduct accurate RF measurements on Remote Radio Heads (RRHs) while remaining at ground level, eliminating the considerable expense and time associated with calling a tower crew to conduct interference measurements.

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Tektronix expands DPO70000SX ATI high performance oscilloscope family

Tektronix Inc., the world's leading manufacturer of oscilloscopes, announced the expansion of its DPO70000SX Performance Oscilloscope Seriesto include 50 GHz and 23 GHz models. By extending our flagship 70 GHz model, the new 50 GHz product is ideal for engineers and researchers who want to take advantage of the superior low-noise performance of the patented asynchronous time interleaving (ATI) architecture for technologies such as 28 GBaud PAM4 and Kband frequency testing. The 23 GHz instrument joins the existing 33GHz models which feature compact dimensions and built-in scalability using the UltraSync synchronization technology.

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Accel-RF announces Quantum SMART bench-top semiconductor test system

Accel-RF Instruments Corp., the worldwide leader in turn-key reliability and performance characterization test systems for compound semiconductors, has “unplugged” the industry-leading RF SMART Fixture from their automated test platform and made it available for bench-top testing. “Quantum-SMART” enables concurrent testing for reliability validation, performance-characterization, and product qualification through RF-biased burn-in and product functional testing.

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Keysight Technologies introduces low-frequency ENA Series VNA options

Keysight Technologies Inc. announced five new frequency options for its E5063A ENA series network analyzerand set the E5063A’s new starting price at $10,000. With these new options and price, the E5063A now offers the best balance between price and performance. This allows passive component manufacturers to satisfy business and technical requirements.

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Anritsu introduces modular, scalable remote spectrum monitor platform

Anritsu Co., the global leader who introduced the first handheld wireless network analyzer 20 years ago, ushers in a new era of field wireless testing with the introduction of Remote Spectrum Monitor, a platform of modular and scalable products that helps operators generate a greater return on their multi-billion dollar spectrum investments and maximizes network capacity to meet consumer demand.

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Autotestcon 2013

Schaumburg, IL



Best Practices to Optimize Power Meter Sensor Measurements


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Trade Shows


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National Harbor, MD
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IMD Measurements with IMDView MS4640B Series Vector Network Analyzer

Intermodulation distortion (IMD) is an important consideration in microwave and RF component design. A common technique for testing IMD is the use of two tones. Two-tone testing for IMD has been used to characterize the non-linearity of microwave and RF components, both active and passive, for a very long time. Traditionally, this has been done at fixed frequencies using multiple signal generators, a combiner, and a spectrum analyzer. Because IMD varies with frequency, these measurements must be repeated at various frequencies to get a clear picture of what a deviceâ??s true behavior is across its specified operating range. This can be a time consuming process using the traditional signal generators and spectrum analyzers. The Anritsu VectorStar MS4640B Series Vector Network Analyzers can be used to quickly and accurately make S parameter, gain compression, fixed and swept frequency IMD measurements using a single cable connection to the DUT.

Speed Time to Market with Consistent Measurements from R&D Through Manufacturing

When multiple instrument form factors such as benchtop and PXI instruments are used in your design and manufacturing processes the challenge is to achieve reliably consistent measurement results while using the best instrument for a specific purpose. This application note provides a no-sacrifice-required solution for achieving consistent measurement results that correlate across instrument types, throughout the product development cycle.

New Pulse Analysis Techniques for Radar and EW

Pulse signals are widespread in radar and other EW applications and must be accurately measured for manufacturing, design of countermeasures, and threat assessment. However, pulse measurements are an especially challenging area for signal analysis due to a combination of factors such as wide pulse bandwidth, pulses that are difficult to detect, and increasingly complex signal environments. This application note discusses the best tools for different types of pulse analysis, along with display and analysis techniques for various signals and measurement goals.

How to Select an Analog Signal Generator

Today's microwave and wireless communications market is expanding at an incredible rate, thus increasing the need for test equipment that will help verify the performance of devices and systems. A flexible tool for a broad scope of applications is the signal generator because of its wide frequency range, high output power and variety of modulations. For example, signal generators with a minimum frequency of 9 kHz permit applications in EMC measurements. Frequency coverage up to 12.75 GHz covers ISM bands as well as all important mobile radio bands. Microwave signal generators may cover or support frequencies up to 20 GHz, 40 GHz and even 110 GHz.

7 Tips for Selecting Modular Test Equipment for Wireless Applications

Many multifunction devices require wider bandwidths, complex modulation schemes and multiple transmit and receive chains, which significantly increases device complexity and test expense. This application note provides useful tips on how to select the right test instruments which enable you to reduce design time, increase production throughput, and ultimately reduce your costs associated with test.

Modern Vector Network Analyzer Test Solutions Improve On-Wafer Measurement Efficiency

Semiconductor manufacturing test engineers face challenges related to broadband millimeter wave (MMW) on-wafer testing. Achieving accurate, stable measurements, typically performed using VNAs, over extended time periods is a challenge for foundries and fab-less semiconductor companies that require extensive on-wafer devices testing. This paper examines the impact of calibration downtime during on-wafer testing and recent advances enabling longer time periods between calibrations.

A Simple Approach to Signal Via Stubs for Coaxial PCB Connector Launches

When designing printed circuit boards launches for coaxial test connectors, there are a number of aspects to consider in order to get the clearest picture of the intended device under test. Learn a relatively simple approach to modeling back-drilled vias and a rough "rule of thumb" to modeling them without electrical modeling tools.

Build Applications Tailored for Remote Signal Monitoring with the Signal Hound BB60C

The Signal Hound BB60C operates and is powered by connecting to a host PC through a USB 3.0 cable. Remote spectrum analyzer and PC management tasks are accomplished over an Ethernet connection through the use of a low cost Intel vPro- enabled PC, such as the Intel NUC, model DC53427HYE, paired with each BB60C. Intel's vPro technology keeps the Ethernet port powered on, even when the Core i5 processor is turned off, so that it can always receive commands.

Calculating a Calibration Factor

Technicians and engineers use calibration factors when making measurements; but where do these calibration factors really come from?

Modern Architecture Advances Vector Network Analyzer Performance

Modern Vector Network Analyzer (VNA) architectures such as those based on Nonlinear Transmission Line (NLTL) samplers and distributed harmonic generators now offer a beneficial alternative to traditional sampling VNAs. They allow for a simplified architecture and also enable VNAs that are much more cost effective. It is shown that NLTL technology results in miniature VNA reflectometers that provide enhanced performance over broad frequency ranges, and reduced measurement complexity, providing VNA users a unique and compelling solution for their high-frequency measurement needs.


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