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Test and Measurement Channel

Test and Measurement related topics

ARTICLES

Agilent offers first user-extensible recorder application for real-time spectrum analyzers

April 16, 2014

Agilent Technologies Inc. announced the availability of the option RTR, the industry’s first real-time spectrum recorder and analyzer application example for real-time spectrum analyzers (RTSAs).


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Anritsu introduces first broadband VNA system that operates from 70 kHz to 145 GHz in single coax connection

April 16, 2014

Anritsu Co. establishes a new standard in broadband performance with the introduction of the VectorStar™ ME7838D broadband system that provides industry-best frequency coverage of 70 kHz to 145 GHz in a single sweep using a coaxial test port. Also boasting best-in-class dynamic range, calibration and measurement stability, and measurement speed, the VectorStar ME7838D gives design engineers greater confidence when performing on-wafer device characterization at 70 GHz and beyond, including applications such as 77 GHz car radar, E band wireless communications, 94 GHz remote sensing and airport radar, as well as emerging applications above 110 GHz.


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Agilent Technologies announces single-slot eight-channel 8-bit PCIe Gen2 digitizer

April 15, 2014

Agilent Technologies Inc. introduces an eight-channel version of its U5309A 8-bit single-slot PCIe®Gen2 digitizer with on-board processing, providing unprecedented channel density and minimum footprint at this level of performance.


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Fraunhofer selects Anritsu 145 GHz vector network analyser system

April 14, 2014

The Fraunhofer Institute for high frequency physics and radar technology has decided to use the world's first 145 GHz broadband millimetre-wave test system, based upon the ME7838A system from Anritsu.


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The Evolving Role of RF Test and Modeling Tools for RFICs

Executive Interview with Stephane Dellier, co-founder of AMCAD-Engineering
April 14, 2014

Stephane DellierStephane Dellier, co-founder of AMCAD-Engineering Inc., talks about his company's RF design services and the evolving role of RF test and modeling for the IC market.


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Anite is first to offer 4x4 MIMO device testing capability

April 10, 2014

Anite, a global leader in wireless equipment testing technology, announced that it is first to offer chipset and device manufacturers the ability to verify their 4x4 Downlink (DL) MIMO designs and products, accelerating the development of LTE and LTE-Advanced devices. The milestone was achieved in close collaboration with a leading device manufacturer using Anite’s Development Toolset - an easy to use solution for early stage testing.. 


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Anritsu introduces 110 GHz broadband VNA system

Test & Measurement
April 9, 2014

Anritsu Co. introduces the VectorStar™ ME7838E Vector Network Analyzer (VNA) broadband system that provides frequency coverage of 70 kHz to 110 GHz in a single connection. The ME7838E addresses the challenges associated with today’s high-speed device characterization.


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Agilent and FIME announce availability of mobile payment test systems based on EMV contactless level 1 specifications

April 9, 2014

Agilent Technologies Inc. and FIME, a secure-chip consulting and testing provider, announced the availability of test systems based on the EMV® Contactless Level 1 Specification for mobile payments.


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Agilent simplifies discontinuous disturbance measurements with new capabilities in MXE EMI receiver

Test & Measurement
April 3, 2014

Agilent Technologies Inc. announced the addition of disturbance analyzer capabilities as a standard feature of its N9038A MXE EMI receiver. For discontinuous-disturbance measurements, the MXE simplifies and automates data collection, analysis and report generation.


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Agilent announces NFC Forum approval for analog test system

April 1, 2014

Agilent Technologies Inc. announced the successful validation of its T3111S NFC Test System for NFC Forum Analog testing.


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IMAGE GALLERIES

Autotestcon 2013

Schaumburg, IL

EVENTS

Techniques for Precise Cable and Antenna Measurements in the Field

4/23/14

Agilent Technologies
FieldFox Handheld Analyzers Education Series

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IEEE Autotestcon 2014

9/15/14
America's Center Convention Complex
St. Louis, MO
United States

DOCUMENTS AND FILES

Wireless Telecommunications Testing with "S" Series Microwave Power Amplifiers

March 17, 2014
AR RF/Microwave Instrumentation offers a broad range of power amplifiers covering DC to 45 GHz with output power ranging from 1 to 16,000 watts. While applications include Electromagnetic Compatibility testing (EMC), RF component testing, physics (plasma generation) and chemistry (mass spectroscopy) applications, military (jammers, radar), material testing (ultrasound), medical diagnostic testing (NMR, MRI) and general lab use, this applications note focuses on a line of amplifiers that has been optimized for wireless telecommunications test use.

Long-Term, Remote Monitoring of Satellite Performance Using an Agilent High-Frequency USB Power Sensor

March 17, 2014
This application note describes typical satellite applications that require power measurements and recommends power measurement solutions. It also explains how these solutions can help simplify your work, and improve accuracy, reliability and test coverage. Also covered are new sensor functions such as built-in Gamma and S-parameter corrections and real time measurement uncertainty calculations for improved accuracy.

Achieving Excellent Vector Signal Analysis Results Using Innovative Noise, Image, and Spur Suppression Techniques

March 17, 2014
The need to measure spurious and harmonic signals is not new. However, emerging requirements include more of these measurements and specify demanding test conditions. In aerospace and defense applications, the task may be a search for known or unknown signals across a broad spectrum. In wireless communications, the need is to characterize increasingly complex devices in an ever-expanding number of conditions and device states - and do so as quickly as possible.

Techniques for Precision Validation of Radar System Performance in the Field Using Agilent FieldFox Handheld Analyzers

March 17, 2014
This application note provides an overview of field testing radar systems and Line Replaceable Units (LRU) using high-performance� FieldFox combination analyzers having multiple measurement modes including a peak power analyzer, vector network analyzer, spectrum analyzer and vector voltmeter. This application note will show several measurement examples of pulsed and secondary radar signals and also reviews the basics of� monopulse radar.

Overcoming High-speed Interconnect Challenges

January 17, 2014
Cloud computing, smart phones, and LTE services are causing a large increase in network traffic. Instantaneous traffic rates at internet data centers have reached 1 Tbit/s. Supporting this increased traffic, speed of IT equipment used in high-end services in data centers must be increased. This white paper discusses challenges introduced at these higher data rates and how Vector Network Analyzers can help meet these.

Automotive RF Immunity Testing using Peak Power Meters

December 17, 2013
The Boonton model 55006 USB Peak Power Sensor and 4542 benchtop Power meter used with model 57006 Peak Power sensor or model 51011 EMC power sensors are the instruments of choice for capturing, displaying and analyzing RF power for automotive EMC and RF immunity testing. This application paper focuses on discussing the usage of peak power meters in RF immunity testing for EMC purposes.

Modern VNA Test Solutions Improve On-Wafer Measurement Efficiency

December 17, 2013
Semiconductor manufacturing test engineers face increased broadband millimeter wave (MMW) on-wafer testing challenges. Developing accurate models often requires measuring frequencies ranging from near DC up to 100+ GHz. Achieving accurate, stable measurements over extended time periods is challenging. This white paper discusses the impact of calibration downtime during on-wafer testing and how to enable longer time periods between calibrations.

Simplifying Power Added Efficiency Testing

December 17, 2013
In most power added efficiency (PAE) test setups, multiple instruments are used to measure RF, voltage, and current. Measurements may require the use of an RF power meter or digital oscilloscope (DSO) with diode detectors to determine the RF power, while digital multimeters are used to measure voltage and current. The Agilent Technologies 8990B peak power analyzer (PPA) provides an alternative setup which allows power added efficiency testing to be done on a single instrument.

A New Coaxial Flow Calorimeter for Accurate RF Power Measurements up to 100 W and 1 GHz

November 19, 2013
This white paper describes new methodology and instrumentation for minimizing measurement uncertainty when measuring RF power at power levels of up to 100 W below 1 GHz. The paper discusses two commonly used methods: using low-power sensors traceable through microcalorimeters, and direct measurement of high power using a flow calorimeter that converts the electrical energy from an RF source into thermal energy via a liquid-cooled resistive load. While both methods are functional, the flow calorimeter carries advantages in measurement uncertainties and process automation. The paper outlines a new approach that improves measurement accuracy with greater simplicity.

Best-in-Class WLAN Measurements

November 19, 2013
The most recent 802.11 standard presents some challenges as discussed in The Next Evolution of Wireless LAN white paper. It is not surprising that test engineers have been scrambling to find the right test equipment to test this standard. Many test engineers have now realized that the old method of finding an expensive boxed instrument with the best performance numbers is now dead. Why, you may ask? The answer is simple: test engineers are getting starved for resources, mainly time, money, and space. The modern breed of test engineers is already using intuitive new technologies to reduce space and decrease test and development time all in a reduced budget. National Instruments is helping test engineers address these challenges with user-programmable FPGA-based instrumentation. This paper discusses the benefits of using an open field-programmable gate array (FPGA) for 802.11ac testing specifically.

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