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Test and Measurement Channel

Test and Measurement related topics

ARTICLES

Teledyne LeCroy introduces a new USB 3.1 end-to-end test suite

Teledyne LeCroy introduces the QPHY-USB3.1-Tx-Rx package for automated USB 3.1 transmitter (Tx) and receiver (Rx) compliance testing, characterization, and debug, creating a unique and comprehensive USB 3.1 test suite. With the new test package, USB 3.1 testing can be performed on both Gen1 (5 Gb/s) and Gen2 (10 Gb/s) devices under test according to the latest USB 3.1 specifications.


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Tektronix announces 70 GHz real time oscilloscope with industry best signal fidelity

Tektronix, Inc., the world's leading manufacturer of oscilloscopes, announced the DPO70000SX 70 GHz ATI Performance Oscilloscope featuring the lowest-noise and highest effective bits of any ultra-high bandwidth real-time oscilloscope available on the market. The new oscilloscope incorporates a range of innovations that enable it to more effectively meet the current and future needs of engineers and scientists developing high-speed coherent optical systems or performing leading-edge research.


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Keysight introduces continuous acquisition stream capability for PCIe digitizers

Keysight Technologies Inc. introduced continuous simultaneous acquisition and readout (CSR) for its U5303A 12-bit PCIe digitizer. In addition, complete data recording software applications are available, such as digitizer streaming (application option CB0) and digital down-converter streaming (application option CB1).


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Cobham AvComm announces automated test and alignment support for Motorola radios

Cobham AvComm, formerly Aeroflex AvComm business unit, announced new automated test and alignment support for Motorola APX Series and Motorola MOTOTRBO Series radios to its latest product; the 8800 Series Digital Radio Test Set. The application fully automates radio testing and alignment, and ensures optimum radio performance in significantly less time; minimizing service and support costs for the end users and dealers.


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IMAGE GALLERIES

Autotestcon 2013

Schaumburg, IL

EVENTS

Webinars

Advanced Multi-Emitter Radar Simulation with Off-the-Shelf T&M Equipment

4/22/15


Technical Education Webinar Series

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Webinars

802.11ah, Bluetooth LE, Zigbee and Wi-SUN Test for IoT/M2M

4/23/15

Keysight Logo    Keysight Technologies Webcast

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DOCUMENTS AND FILES

7 Tips for Selecting Modular Test Equipment for Wireless Applications

Many multifunction devices require wider bandwidths, complex modulation schemes and multiple transmit and receive chains, which significantly increases device complexity and test expense. This application note provides useful tips on how to select the right test instruments which enable you to reduce design time, increase production throughput, and ultimately reduce your costs associated with test.

Modern Vector Network Analyzer Test Solutions Improve On-Wafer Measurement Efficiency

Semiconductor manufacturing test engineers face challenges related to broadband millimeter wave (MMW) on-wafer testing. Achieving accurate, stable measurements, typically performed using VNAs, over extended time periods is a challenge for foundries and fab-less semiconductor companies that require extensive on-wafer devices testing. This paper examines the impact of calibration downtime during on-wafer testing and recent advances enabling longer time periods between calibrations.

A Simple Approach to Signal Via Stubs for Coaxial PCB Connector Launches

When designing printed circuit boards launches for coaxial test connectors, there are a number of aspects to consider in order to get the clearest picture of the intended device under test. Learn a relatively simple approach to modeling back-drilled vias and a rough "rule of thumb" to modeling them without electrical modeling tools.

Build Applications Tailored for Remote Signal Monitoring with the Signal Hound BB60C

The Signal Hound BB60C operates and is powered by connecting to a host PC through a USB 3.0 cable. Remote spectrum analyzer and PC management tasks are accomplished over an Ethernet connection through the use of a low cost Intel vPro- enabled PC, such as the Intel NUC, model DC53427HYE, paired with each BB60C. Intel's vPro technology keeps the Ethernet port powered on, even when the Core i5 processor is turned off, so that it can always receive commands.

Calculating a Calibration Factor

Technicians and engineers use calibration factors when making measurements; but where do these calibration factors really come from?

Modern Architecture Advances Vector Network Analyzer Performance

Modern Vector Network Analyzer (VNA) architectures such as those based on Nonlinear Transmission Line (NLTL) samplers and distributed harmonic generators now offer a beneficial alternative to traditional sampling VNAs. They allow for a simplified architecture and also enable VNAs that are much more cost effective. It is shown that NLTL technology results in miniature VNA reflectometers that provide enhanced performance over broad frequency ranges, and reduced measurement complexity, providing VNA users a unique and compelling solution for their high-frequency measurement needs.

Increase Power Amplifier Test Throughput with the Keysight PXIe Vector Signal Generator and Analyzers

Read this application note for an overview of the key challenges in testing power amplifiers and front end modules with envelope tracking. Learn about how to reduce test cost, achieve fast throughput, and maintain high test quality using the modular Keysight M9381A PXIe VSG, and the M9391A or M9393A PXIe VSA, as well as how to perform high speed harmonic test using the M9393A PXIe VSA.

Output Standing Wave Ratio (SWR) Test Using the TEGAM 1830A RF Power Meter

Do you have confidence that your 50 MHz reference port Standing Wave Ratio (SWR) is within specifications? It is important to have this confidence and by adhering to these procedures, you can be certain that your 50 MHz reference is within the manufactures tolerance!

Techniques for Precise Cable and Antenna Measurements in the Field Using Agilent FieldFox Handheld Analyzers

This application note introduces the practical aspects of cable and antenna testing. It covers interpreting measurement results and instrument operation including calibration options such as CalReady and QuickCal using FieldFox configured as a cable and antenna analyzer. Measurement examples are provided showing techniques for measuring insertion loss, return loss, and locating faults in a transmission system.

Testing S-Parameters on Pulsed Radar Power Amplifier Modules

This Application Note describes testing S-parameters under pulsed conditions. A constant power level calibration is included. A LDMOS S-band radar power transistor is used as example DUT. The pulse profile mode of the R&S ZVA is used to analyze the time-dependent behavior of the DUT.

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