Teledyne LeCroy introduces the QPHY-USB3.1-Tx-Rx package for automated USB 3.1 transmitter (Tx) and receiver (Rx) compliance testing, characterization, and debug, creating a unique and comprehensive USB 3.1 test suite. With the new test package, USB 3.1 testing can be performed on both Gen1 (5 Gb/s) and Gen2 (10 Gb/s) devices under test according to the latest USB 3.1 specifications.
Anritsu Co. introduces the MN4765B O/E Calibration Module for its MS4640B Series VectorStar® vector network analyzers (VNAs) that creates a cost-effective and flexible solution for measuring 40 Gb/s components and transceivers.
Tektronix, Inc., the world's leading manufacturer of oscilloscopes, announced the DPO70000SX 70 GHz ATI Performance Oscilloscope featuring the lowest-noise and highest effective bits of any ultra-high bandwidth real-time oscilloscope available on the market. The new oscilloscope incorporates a range of innovations that enable it to more effectively meet the current and future needs of engineers and scientists developing high-speed coherent optical systems or performing leading-edge research.
Supporting the Microwave Vision Group’s (MVG) vision to bring all products together under one strong brand, Satimo Industries will begin to operate under the new name, MVG Industries, with effective immediately.
Rohde & Schwarz is presenting a novel 5G channel sounding solution in cooperation with Fraunhofer Heinrich Hertz Institute (HHI) at the NGMN Industry Conference in Frankfurt/Main, Germany, which runs from March 24-25, 2015.
Teseq introduces an eight-channel arbitrary waveform generator for automotive testing. The ARB 5500 fits inside the transient generator and features memory for over 64,000 standard waveform segments as well as 1 GB of Clone memory for user-defined shapes. This is enough memory for several thousand hours of simulations.
Keysight Technologies Inc. introduced continuous simultaneous acquisition and readout (CSR) for its U5303A 12-bit PCIe digitizer. In addition, complete data recording software applications are available, such as digitizer streaming (application option CB0) and digital down-converter streaming (application option CB1).
Cobham AvComm, formerly Aeroflex AvComm business unit, announced new automated test and alignment support for Motorola APX Series and Motorola MOTOTRBO Series radios to its latest product; the 8800 Series Digital Radio Test Set. The application fully automates radio testing and alignment, and ensures optimum radio performance in significantly less time; minimizing service and support costs for the end users and dealers.
Accel-RF Instruments Corp., the worldwide leader in turn-key reliability and performance characterization test systems for compound semiconductors, announces its participation in the upcoming GOMACTech 2015 Conference. GOMACTech will take place March 23-26 at the Union Station Hotel in St. Louis, Mo.
Anite has signed a memorandum of understanding with China Telecommunication Technology Labs – Terminals, with the aim of collaborating to progress development of cutting-edge MIMO Over-The-Air testing methodologies and solutions.
Many multifunction devices require wider bandwidths, complex modulation schemes and multiple transmit and receive chains, which significantly increases device complexity and test expense. This application note provides useful tips on how to select the right test instruments which enable you to reduce design time, increase production throughput, and ultimately reduce your costs associated with test.
Semiconductor manufacturing test engineers face challenges related to broadband millimeter wave (MMW) on-wafer testing. Achieving accurate, stable measurements, typically performed using VNAs, over extended time periods is a challenge for foundries and fab-less semiconductor companies that require extensive on-wafer devices testing. This paper examines the impact of calibration downtime during on-wafer testing and recent advances enabling longer time periods between calibrations.
When designing printed circuit boards launches for coaxial test connectors, there are a number of aspects to consider in order to get the clearest picture of the intended device under test. Learn a relatively simple approach to modeling back-drilled vias and a rough "rule of thumb" to modeling them without electrical modeling tools.
The Signal Hound BB60C operates and is powered by connecting to a host PC through a USB 3.0 cable. Remote spectrum analyzer and PC management tasks are accomplished over an Ethernet connection through the use of a low cost Intel vPro- enabled PC, such as the Intel NUC, model DC53427HYE, paired with each BB60C. Intel's vPro technology keeps the Ethernet port powered on, even when the Core i5 processor is turned off, so that it can always receive commands.
Modern Vector Network Analyzer (VNA) architectures such as those based on Nonlinear Transmission Line (NLTL) samplers and distributed harmonic generators now offer a beneficial alternative to traditional sampling VNAs. They allow for a simplified architecture and also enable VNAs that are much more cost effective. It is shown that NLTL technology results in miniature VNA reflectometers that provide enhanced performance over broad frequency ranges, and reduced measurement complexity, providing VNA users a unique and compelling solution for their high-frequency measurement needs.
Read this application note for an overview of the key challenges in testing power amplifiers and front end modules with envelope tracking. Learn about how to reduce test cost, achieve fast throughput, and maintain high test quality using the modular Keysight M9381A PXIe VSG, and the M9391A or M9393A PXIe VSA, as well as how to perform high speed harmonic test using the M9393A PXIe VSA.
Do you have confidence that your 50 MHz reference port Standing Wave Ratio (SWR) is within specifications? It is important to have this confidence and by adhering to these procedures, you can be certain that your 50 MHz reference is within the manufactures tolerance!
This application note introduces the practical aspects of cable and antenna testing. It covers interpreting measurement results and instrument operation including calibration options such as CalReady and QuickCal using FieldFox configured as a cable and antenna analyzer. Measurement examples are provided showing techniques for measuring insertion loss, return loss, and locating faults in a transmission system.
This Application Note describes testing S-parameters under pulsed conditions. A constant power level calibration is included. A LDMOS S-band radar power transistor is used as example DUT. The pulse profile mode of the R&S ZVA is used to analyze the time-dependent behavior of the DUT.