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Test and Measurement Channel

Test and Measurement related topics

ARTICLES

Agilent Technologies’ ADS selected by ADATA

May 15, 2012

Agilent Technologies Inc. announced that ADATA Technology Co.,  a provider of complete memory solutions in Taipei, Taiwan, has selected Agilent’s Advanced Design System (ADS) software for developing memory modules for the high-speed digital market. Using ADS will help ADATA bring products to market faster and reduce costs.


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Anritsu introduces tracking generator with CW generator

May 15, 2012

Anritsu Co. introduces a tracking generator for its Spectrum Master™ MS2711E, MS2712E, and MS2713E models that enhances the overall performance of the handheld analyzers, while making it easier and faster for field technicians to conduct additional measurements. With the tracking generator installed, the Spectrum Master analyzers can be used by service providers, R&D engineering, contractors, installers, public safety organizations, and broadcast stations to conduct highly accurate measurements and improve efficiency when deploying, installing, and maintaining networks.


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Exploit the Radio Channel for Improved MIMO Performance

May 15, 2012

Introduction to the new EB Propsim® F32 radio channel emulator that meets the demanding design and verification challenges of today's and future wireless technologies


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Signal Generators Provide Perfect and Precisely Imperfect Signals

May 15, 2012
Introduction to the new X-Series of signal generators that are available in analog and vector modulation models, from the pure and precise MXG to the cost-effective EXG
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Global Navigation Satellite Systems and Their Applications

May 14, 2012
Provides an overview of the different navigation systems, explains the navigation channel and generic approach used by a commercial receiver to calculate a user position and describes channel acquisition and tracking
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CST and Delcross announce distribution agreement

May 14, 2012

CST has announce that Delcross Technologies’ Electromagnetic Interference Toolkit (EMIT) is now available through the CST of America sales channel. The software will be fully supported by CST’s skilled team of electromagnetic specialists.


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Lake Shore Cryotronics to feature cryogenic and cryogen-free probe stations at IMS

May 11, 2012

Lake Shore Cryotronics Inc., a manufacturer of scientific sensors, instruments, and systems for precise measurement and control, announces that it will be featuring its line of cryogenic and cryogen-free closed cycle refrigerator (CCR) probe stations at the International Microwave Symposium, to be held June 17-22, 2012, in Montréal, Canada.


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New Teseq EMI receiver reduces test time, improves accuracy

May 11, 2012

Teseq Inc. now offers a new EMI receiver that reduces test time from hours to seconds and improves accuracy. The PMM 9010F is ideal for conducted and radiated emissions testing of appliances, power tools and machinery. This new EMI receiver is up to 300 times faster than the PMM 9010.


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Agilent announces voice-over-LTE test system developed with Brüel & Kjær

May 11, 2012

Agilent Technologies Inc. announced that the Agilent PXT wireless communications test set is now available for testing voice quality on Voice-over-LTE (VoLTE) 4G phones with the Brüel & Kjær PULSE Audio Analyzer and Head and Torso Simulator (HATS).


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New amplifier & mixer solutions for backhaul radios to 46.5 GHz

May 11, 2012

Hittite Microwave Corp. announced the release of two new amplifier and three new mixer products that are ideal for microwave & millimeterwave radios, military sensors, test & measurement equipment and SatCom applications from 24 to 46.5 GHz.


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EVENTS

Hybrid-Active Load Pull with PNA-X and Maury Microwave

06/12/12

Agilent Technologies
Innovations in Network Analysis Webcast Series

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Multi-Signal, Multi-Format Analysis with the VSA

04/25/12

Agilent Technologies
Signal Generation and Analysis Webcast Series

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Nonlinear Characterization and Modeling through Pulsed IV/S-Parameters

03/27/12

Agilent Technologies
Innovations in Network Analysis Webcast Series

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Mini-Circuits' Smart Portable Test Equipment

03/13/12


Technical Education Webinar Series Read More

RF Back to Basics: Part 2 - Signal Generation

02/29/12
Agilent Technologies
Innovations in Signal Generation and Analysis Webcast Series Read More

DOCUMENTS AND FILES

Statistical Analysis of Modern Communication Signals

May 14, 2012
The introduction of this digital transmission technology has made it necessary to deal with peak power levels up to 20 dB above the average value. All of the RF power components must be capable of handling these high voltage peaks to avoid break down, or flash over.

Redefining RF and Microwave Instrumentation

May 14, 2012
National Instruments has redefined the traditional approach by combining PXI hardware and NI LabVIEW system design software, leveraging commercial technologies such as multicore microprocessors, user-programmable FPGAs, PCI Express hardware, and system design software to meet the flexibility and scalability demand for future high-frequency test and measurement applications.

How to Measure 5-nanosecond Rise/Fall Time in Pulsed Power Amplifiers

April 06, 2012
Rise/fall time is one of the key measurement parameters when designing, manufacturing or maintaining pulsed radar power amplifier systems, especially for wideband pulse power amplifiers. Learn how to achieve 5 nanosecond rise/fall time RF pulse measurement with the 8990B peak power analyzer by reading this application note. This article also includes tips on how to consistently obtain accurate rise/fall time measurement results.

Voice and SMS in LTE

April 06, 2012
This white paper summarizes the technology options for supporting voice and short message service (SMS) in LTE, including circuit switched fallback (CSFB), SMS over SGs, and voice over LTE (VoLTE). It includes background information on the standardization process, and the commercial implications for the different options. The white paper also addresses test and measurement requirements resulting from the support of voice and SMS in LTE.

Improving Measurement Accuracy for High Frequency RF Connectors

April 06, 2012
Improving the accuracy of your microwave test and measurement equipment becomes increasingly important when high frequency devices are used in the transmission paths of radio, cellular, satellite and digital communications. This discussion helps to solve problems with measurement errors during and after calibration of your microwave test instrument.

How to measure 5-nanosecond rise/fall time in pulsed power amplifiers

March 14, 2012
Rise/fall time is one of the key measurement parameters when designing, manufacturing or maintaining pulsed radar power amplifier systems, especially for wideband pulse power amplifiers. Learn how to achieve 5 nanosecond rise/fall time RF pulse measurement with Agilent Technologies 8990B peak power analyzer by reading this application note. This article also includes tips on how to consistently obtain accurate rise/fall time measurement results.

Multi-tone Testing Can Save Both Time and Money

March 14, 2012
AR RF/Microwave Instrumentation has developed a product which uses a patented test process that adds additional test frequencies, or tones, for each test period, or dwell time.

Richardson RFPD Test & Measurement Capabilities

March 01, 2012
Richardson RFPD's interactive Online Product Selector provides quick, easy access to our extensive selection of RF Test and Measurement components, cable assemblies, and accessories from the industry's top brands.

Solutions for LTE-Advanced Physical Layer Design and Test

February 15, 2012
LTE-Advanced (LTE-A) is an emerging mobile communications standard that boasts a number of significant benefits, including the ability to take advantage of advanced topology networks and achieve target peak data rates of 1 Gbps in the downlink and 500 Mbps in the uplink. This white paper covers using signal generation and analysis to overcome challenges associated with carrier aggregation.

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