advertisment Advertisement
This ad will close in  seconds. Skip now
advertisment Advertisement
advertisment Advertisement
advertisment Advertisement
advertisment Advertisement

Test and Measurement Channel

Test and Measurement related topics

ARTICLES

Keysight announces industry’s first 50 GHz handheld combination analyzer

Keysight Technologies Inc. added six millimeter-wave models to its family of FieldFox handheld analyzers. The flagship model is the industry’s first handheld combination analyzer to provide coverage to 50 GHz. With more built-in capabilities than similar analyzers, FieldFox can replace three or four single-function instruments – benchtop or handheld – that are typically used for maintenance and troubleshooting of systems that operate at or above Ka-band frequencies.


Read More

Cobham AvComm’s 8800S has auto-test functionality for Motorola XTS® and XTL™ series radios

 Cobham AvComm, formerly Aeroflex AvComm business unit, announced automated test and alignment support for Motorola XTS and XTL series radios. Cobham AvComm’s latest product, the 8800S Digital Radio Test Set, is equipped with the application that fully automates radio testing and alignment. This ensures optimum radio performance in significantly less time, minimizing service and support costs for the end users and dealers. 


Read More

PCTEST partners with Anritsu to offer leading LTE eMBMS Test Portfolio

Anritsu Co. announces PCTEST Engineering Laboratory Inc. has acquired all elements of Anritsu’s leading LTE Enhanced Multimedia Broadcast Multicast Services (eMBMS) test portfolio, including eMBMS RF Performance test cases on Anritsu’s ME7873L RF/RRM Conformance Test System (CTS) as well as Carrier Acceptance Test (CAT) and Protocol Conformance Test (PCT) test cases on the ME7834L Mobile Device Test Platform (MDTP).

Read More

NI drives down cost of wireless production test

NI, the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, released the Wireless Test System (WTS), a solution that dramatically lowers the cost of high-volume wireless manufacturing test. Although faced with the rising complexity of wireless test, companies can confidently reduce test costs and multiply throughput on the production floor with a system optimized for measurement speed and parallel test.


Read More

AT4 wireless selects Anite’s channel emulation solution

 Anite, a global leader in wireless equipment testing technology, announced that its Propsim F32 channel emulator has been selected by AT4 wireless for its first anechoic MIMO1 Over-the-Air (OTA) test laboratory in Spain. The laboratory has been set up to perform device testing compliant with CTIA certification requirements prior to market introduction. 


Read More

IMAGE GALLERIES

Autotestcon 2013

Schaumburg, IL

EVENTS

Webinars

Reducing VNA Test Costs and Decreasing Test Times

9/23/15


Technical Education Webinar Series

Read More

Trade Shows

IEEE AUTOTESTCON 2015

11/2/15
Gaylord Convention Center & Hotel
National Harbor, MD
United States

DOCUMENTS AND FILES

IMD Measurements with IMDView MS4640B Series Vector Network Analyzer

Intermodulation distortion (IMD) is an important consideration in microwave and RF component design. A common technique for testing IMD is the use of two tones. Two-tone testing for IMD has been used to characterize the non-linearity of microwave and RF components, both active and passive, for a very long time. Traditionally, this has been done at fixed frequencies using multiple signal generators, a combiner, and a spectrum analyzer. Because IMD varies with frequency, these measurements must be repeated at various frequencies to get a clear picture of what a deviceâ??s true behavior is across its specified operating range. This can be a time consuming process using the traditional signal generators and spectrum analyzers. The Anritsu VectorStar MS4640B Series Vector Network Analyzers can be used to quickly and accurately make S parameter, gain compression, fixed and swept frequency IMD measurements using a single cable connection to the DUT.

Speed Time to Market with Consistent Measurements from R&D Through Manufacturing

When multiple instrument form factors such as benchtop and PXI instruments are used in your design and manufacturing processes the challenge is to achieve reliably consistent measurement results while using the best instrument for a specific purpose. This application note provides a no-sacrifice-required solution for achieving consistent measurement results that correlate across instrument types, throughout the product development cycle.

New Pulse Analysis Techniques for Radar and EW

Pulse signals are widespread in radar and other EW applications and must be accurately measured for manufacturing, design of countermeasures, and threat assessment. However, pulse measurements are an especially challenging area for signal analysis due to a combination of factors such as wide pulse bandwidth, pulses that are difficult to detect, and increasingly complex signal environments. This application note discusses the best tools for different types of pulse analysis, along with display and analysis techniques for various signals and measurement goals.

How to Select an Analog Signal Generator

Today's microwave and wireless communications market is expanding at an incredible rate, thus increasing the need for test equipment that will help verify the performance of devices and systems. A flexible tool for a broad scope of applications is the signal generator because of its wide frequency range, high output power and variety of modulations. For example, signal generators with a minimum frequency of 9 kHz permit applications in EMC measurements. Frequency coverage up to 12.75 GHz covers ISM bands as well as all important mobile radio bands. Microwave signal generators may cover or support frequencies up to 20 GHz, 40 GHz and even 110 GHz.

7 Tips for Selecting Modular Test Equipment for Wireless Applications

Many multifunction devices require wider bandwidths, complex modulation schemes and multiple transmit and receive chains, which significantly increases device complexity and test expense. This application note provides useful tips on how to select the right test instruments which enable you to reduce design time, increase production throughput, and ultimately reduce your costs associated with test.

Modern Vector Network Analyzer Test Solutions Improve On-Wafer Measurement Efficiency

Semiconductor manufacturing test engineers face challenges related to broadband millimeter wave (MMW) on-wafer testing. Achieving accurate, stable measurements, typically performed using VNAs, over extended time periods is a challenge for foundries and fab-less semiconductor companies that require extensive on-wafer devices testing. This paper examines the impact of calibration downtime during on-wafer testing and recent advances enabling longer time periods between calibrations.

A Simple Approach to Signal Via Stubs for Coaxial PCB Connector Launches

When designing printed circuit boards launches for coaxial test connectors, there are a number of aspects to consider in order to get the clearest picture of the intended device under test. Learn a relatively simple approach to modeling back-drilled vias and a rough "rule of thumb" to modeling them without electrical modeling tools.

Build Applications Tailored for Remote Signal Monitoring with the Signal Hound BB60C

The Signal Hound BB60C operates and is powered by connecting to a host PC through a USB 3.0 cable. Remote spectrum analyzer and PC management tasks are accomplished over an Ethernet connection through the use of a low cost Intel vPro- enabled PC, such as the Intel NUC, model DC53427HYE, paired with each BB60C. Intel's vPro technology keeps the Ethernet port powered on, even when the Core i5 processor is turned off, so that it can always receive commands.

Calculating a Calibration Factor

Technicians and engineers use calibration factors when making measurements; but where do these calibration factors really come from?

Modern Architecture Advances Vector Network Analyzer Performance

Modern Vector Network Analyzer (VNA) architectures such as those based on Nonlinear Transmission Line (NLTL) samplers and distributed harmonic generators now offer a beneficial alternative to traditional sampling VNAs. They allow for a simplified architecture and also enable VNAs that are much more cost effective. It is shown that NLTL technology results in miniature VNA reflectometers that provide enhanced performance over broad frequency ranges, and reduced measurement complexity, providing VNA users a unique and compelling solution for their high-frequency measurement needs.

Sign-In

Forgot your password?

No Account? Sign Up!

Get access to premium content and e-newsletters by registering on the web site.  You can also subscribe to Microwave Journal magazine.

Sign-Up

advertisment Advertisement