advertisment Advertisement
This ad will close in  seconds. Skip now
advertisment Advertisement
advertisment Advertisement
advertisment Advertisement
advertisment Advertisement

Test and Measurement Channel

Test and Measurement related topics

ARTICLES

Anritsu introduces web remote tools for handheld spectrum analyzer

Anritsu Co. introduces Web Remote Tools for its Spectrum Master™ MS2720T handheld spectrum analyzer that allows the instruments to be controlled from any web-enabled device, including laptops, tablets, and smart phones, over an Ethernet link. Web Remote Tools gives field technicians greater flexibility when conducting measurements and makes it more time- and cost-efficient to conduct RF spectrum monitoring, as well as test Remote Radio Heads (RRUs) and other inaccessible radio units at 3G and 4G base stations.


Read More

Anritsu and EMITE announce successful LTE carrier aggregation + MIMO + UMA OTA testing

Anritsu Co. and EMITE announce that the Anritsu MT8820C radio communication tester has been successfully used in combination with the EMITE E500 reverberation chamber and Anite Propsim FS8 channel emulator to test LTE Carrier Aggregation, using 2x2 MIMO and more realistic isotropic Urban-Macro (UMA) fading profiles.


Read More

Anritsu completes testing of GCT Semiconductor's LTE-Advanced single chip

Anritsu Co. announces it successfully completed testing of GCT Semiconductor’s 4G LTE-Advanced chip, GDM7243Q, using Anritsu’s MD8430A signaling tester with Rapid Test Designer (RTD). GCT Semiconductor, a leading designer and supplier of advanced 4G mobile semiconductor solutions, offers an advanced FDD-TDD LTE Category 5/6/7 single chip, with the world’s first 4X4 MIMO carrier aggregation for LTE.


Read More

Maury Microwave acquires Anteverta-MW

Maury Microwave Corp. and Anteverta-mw announced that Maury Microwave has completed the acquisition of Anteverta-mw. This strategic move is expected to further strengthen Maury Microwave in the nonlinear measurement and modeling device characterization market and accelerate innovation for the betterment of markets served by both parties.


Read More

IMAGE GALLERIES

Autotestcon 2013

Schaumburg, IL

EVENTS

Webinars

A Flexible Testbed for 5G Waveform Generation and Analysis

5/7/15

Keysight Logo    Keysight Technologies Webcast

Read More

DOCUMENTS AND FILES

7 Tips for Selecting Modular Test Equipment for Wireless Applications

Many multifunction devices require wider bandwidths, complex modulation schemes and multiple transmit and receive chains, which significantly increases device complexity and test expense. This application note provides useful tips on how to select the right test instruments which enable you to reduce design time, increase production throughput, and ultimately reduce your costs associated with test.

Modern Vector Network Analyzer Test Solutions Improve On-Wafer Measurement Efficiency

Semiconductor manufacturing test engineers face challenges related to broadband millimeter wave (MMW) on-wafer testing. Achieving accurate, stable measurements, typically performed using VNAs, over extended time periods is a challenge for foundries and fab-less semiconductor companies that require extensive on-wafer devices testing. This paper examines the impact of calibration downtime during on-wafer testing and recent advances enabling longer time periods between calibrations.

A Simple Approach to Signal Via Stubs for Coaxial PCB Connector Launches

When designing printed circuit boards launches for coaxial test connectors, there are a number of aspects to consider in order to get the clearest picture of the intended device under test. Learn a relatively simple approach to modeling back-drilled vias and a rough "rule of thumb" to modeling them without electrical modeling tools.

Build Applications Tailored for Remote Signal Monitoring with the Signal Hound BB60C

The Signal Hound BB60C operates and is powered by connecting to a host PC through a USB 3.0 cable. Remote spectrum analyzer and PC management tasks are accomplished over an Ethernet connection through the use of a low cost Intel vPro- enabled PC, such as the Intel NUC, model DC53427HYE, paired with each BB60C. Intel's vPro technology keeps the Ethernet port powered on, even when the Core i5 processor is turned off, so that it can always receive commands.

Calculating a Calibration Factor

Technicians and engineers use calibration factors when making measurements; but where do these calibration factors really come from?

Modern Architecture Advances Vector Network Analyzer Performance

Modern Vector Network Analyzer (VNA) architectures such as those based on Nonlinear Transmission Line (NLTL) samplers and distributed harmonic generators now offer a beneficial alternative to traditional sampling VNAs. They allow for a simplified architecture and also enable VNAs that are much more cost effective. It is shown that NLTL technology results in miniature VNA reflectometers that provide enhanced performance over broad frequency ranges, and reduced measurement complexity, providing VNA users a unique and compelling solution for their high-frequency measurement needs.

Increase Power Amplifier Test Throughput with the Keysight PXIe Vector Signal Generator and Analyzers

Read this application note for an overview of the key challenges in testing power amplifiers and front end modules with envelope tracking. Learn about how to reduce test cost, achieve fast throughput, and maintain high test quality using the modular Keysight M9381A PXIe VSG, and the M9391A or M9393A PXIe VSA, as well as how to perform high speed harmonic test using the M9393A PXIe VSA.

Output Standing Wave Ratio (SWR) Test Using the TEGAM 1830A RF Power Meter

Do you have confidence that your 50 MHz reference port Standing Wave Ratio (SWR) is within specifications? It is important to have this confidence and by adhering to these procedures, you can be certain that your 50 MHz reference is within the manufactures tolerance!

Techniques for Precise Cable and Antenna Measurements in the Field Using Agilent FieldFox Handheld Analyzers

This application note introduces the practical aspects of cable and antenna testing. It covers interpreting measurement results and instrument operation including calibration options such as CalReady and QuickCal using FieldFox configured as a cable and antenna analyzer. Measurement examples are provided showing techniques for measuring insertion loss, return loss, and locating faults in a transmission system.

Testing S-Parameters on Pulsed Radar Power Amplifier Modules

This Application Note describes testing S-parameters under pulsed conditions. A constant power level calibration is included. A LDMOS S-band radar power transistor is used as example DUT. The pulse profile mode of the R&S ZVA is used to analyze the time-dependent behavior of the DUT.

Sign-In

Forgot your password?

No Account? Sign Up!

Get access to premium content and e-newsletters by registering on the web site.  You can also subscribe to Microwave Journal magazine.

Sign-Up

advertisment Advertisement