Keysight Technologies Inc. announced that Asygn, a company specializing in mixed-signal design and verification, and Kalray, a fabless semiconductor company developing many-core processors, have successfully used the Keysight EEsof EDA simulation tool suite to validate PCI Express (PCIe®) Gen3 serial links on Kalray’s MPPA TurboCard2.
Spectrum released three new M4i series Arbitrary Waveform Generators (AWGs), setting new standards in speed and precision. The new models of the M4i.66xx series offer one, two and four channels with each channel capable of outputting electronic signals at rates of up to 625 Megasamples/second (MS/s) with 16 bit vertical resolution. The combination makes these new AWG's ideal for generating high frequency signals up to 200 MHz with the best possible accuracy and fidelity.
Cobham Wireless announced the latest version of the industry-standard TM500 WCDMA network test system, with expanded capability to emulate four cells and hundreds of mobile terminals from a single benchtop unit.
Averna, an industry-leading developer of test solutions and services for communications and electronics device-makers worldwide, announced today the industry’s first RF tool offering high-performance record-and-playback and real-time simulation in one cost-effective platform.
Anritsu Co. and Electro Rent announce that the two companies have signed a formal agreement whereby Electro Rent is a preferred reseller for Anritsu test solutions throughout the United States and Canada. Under terms of the agreement, industry-leading Anritsu benchtop and field instruments will be available through Electro Rent.
Tektronix, a leading manufacturer of oscilloscopes, and The Institute of Electronics, Microelectronics and Nanotechnology (IEMN), a major French research laboratory, announced the world’s first demonstration of a world record breaking wireless system capable of transmitting data at 400 GHz (0.4 THz) using advanced signal coding (up to QAM-16) and key advanced THz devices.
When multiple instrument form factors such as benchtop and PXI instruments are used in your design and manufacturing processes the challenge is to achieve reliably consistent measurement results while using the best instrument for a specific purpose. This application note provides a no-sacrifice-required solution for achieving consistent measurement results that correlate across instrument types, throughout the product development cycle.
Pulse signals are widespread in radar and other EW applications and must be accurately measured for manufacturing, design of countermeasures, and threat assessment. However, pulse measurements are an especially challenging area for signal analysis due to a combination of factors such as wide pulse bandwidth, pulses that are difficult to detect, and increasingly complex signal environments. This application note discusses the best tools for different types of pulse analysis, along with display and analysis techniques for various signals and measurement goals.
Today's microwave and wireless communications market is expanding at an incredible rate, thus increasing the need for test equipment that will help verify the performance of devices and systems. A flexible tool for a broad scope of applications is the signal generator because of its wide frequency range, high output power and variety of modulations. For example, signal generators with a minimum frequency of 9 kHz permit applications in EMC measurements. Frequency coverage up to 12.75 GHz covers ISM bands as well as all important mobile radio bands. Microwave signal generators may cover or support frequencies up to 20 GHz, 40 GHz and even 110 GHz.
Many multifunction devices require wider bandwidths, complex modulation schemes and multiple transmit and receive chains, which significantly increases device complexity and test expense. This application note provides useful tips on how to select the right test instruments which enable you to reduce design time, increase production throughput, and ultimately reduce your costs associated with test.
Semiconductor manufacturing test engineers face challenges related to broadband millimeter wave (MMW) on-wafer testing. Achieving accurate, stable measurements, typically performed using VNAs, over extended time periods is a challenge for foundries and fab-less semiconductor companies that require extensive on-wafer devices testing. This paper examines the impact of calibration downtime during on-wafer testing and recent advances enabling longer time periods between calibrations.
When designing printed circuit boards launches for coaxial test connectors, there are a number of aspects to consider in order to get the clearest picture of the intended device under test. Learn a relatively simple approach to modeling back-drilled vias and a rough "rule of thumb" to modeling them without electrical modeling tools.
The Signal Hound BB60C operates and is powered by connecting to a host PC through a USB 3.0 cable. Remote spectrum analyzer and PC management tasks are accomplished over an Ethernet connection through the use of a low cost Intel vPro- enabled PC, such as the Intel NUC, model DC53427HYE, paired with each BB60C. Intel's vPro technology keeps the Ethernet port powered on, even when the Core i5 processor is turned off, so that it can always receive commands.
Modern Vector Network Analyzer (VNA) architectures such as those based on Nonlinear Transmission Line (NLTL) samplers and distributed harmonic generators now offer a beneficial alternative to traditional sampling VNAs. They allow for a simplified architecture and also enable VNAs that are much more cost effective. It is shown that NLTL technology results in miniature VNA reflectometers that provide enhanced performance over broad frequency ranges, and reduced measurement complexity, providing VNA users a unique and compelling solution for their high-frequency measurement needs.
Read this application note for an overview of the key challenges in testing power amplifiers and front end modules with envelope tracking. Learn about how to reduce test cost, achieve fast throughput, and maintain high test quality using the modular Keysight M9381A PXIe VSG, and the M9391A or M9393A PXIe VSA, as well as how to perform high speed harmonic test using the M9393A PXIe VSA.