advertisment Advertisement
advertisment Advertisement
advertisment Advertisement
advertisment Advertisement

Test and Measurement Channel

Test and Measurement related topics

ARTICLES

Anritsu introduces series of PC-controlled ShockLine VNAs

Test & Measurement

Anritsu Co. expands its ShockLine™ family of vector network analyzers (VNAs) with the introduction of the MS46122A series.


Read More

Rohde & Schwarz expands R&S OSP modular platform

Seven new modules have been added to the R&S OSP open switch and control platform from Rohde & Schwarz.


Read More

Sharp Communications selects Keysight for bluetooth qualified test facility

Test & Measurement

Keysight Technologies Inc. announced that Sharp Communication Compliance (SCC) Ltd., an independent test laboratory that focuses on testing for the wireless communications industry, selected the Keysight T1111S Bluetooth® RF platform for use in its RF classic and low energy test lab.


Read More

Keysight demos LTE-Advanced 450 Mbps end-to-end IP data throughput with wireless test set

Keysight Technologies, Inc. announced verification of three component carrier (3CC) end-to-end IP data throughput with the recently introduced E7515A UXM wireless test set. Utilizing three 20 MHz component carriers in the downlink for a total aggregated bandwidth of 60 MHz, Keysight successfully demonstrated 450 Mbps DL/50 Mbps UL (category 9) data rates.


Read More

Tektronix releases first test solution for MIPI M-PHY specification v3.1

Tektronix, Inc., the world's leading manufacturer of oscilloscopes, announced the first physical layer transmitter characterization and debug solution for the MIPI M-PHY® v3.1 specification recently approved by the MIPI® Alliance. The new Tektronix solution includes support for MIPI M-PHY high speed gears 1, 2 and 3, PWM mode (G0-G7), and SYS mode and offers the industry’s lowest noise solution for MIPI M-PHY measurements when used with Tektronix MSO/DPO 70000DX oscilloscopes and P7600 series probes.


Read More

Anritsu announces GCF LTE protocol conformance for Chinese carriers

As part of its commitment to support global wireless standards, Anritsu Co. announces that it is the market leader in approved test cases for TD-LTE Carrier Aggregation and is the only test company with Global Certification Forum (GCF)-approved TD-LTE test cases in the IMS Voice over LTE (VoLTE)-related technology of aSRVCC.


Read More

New MIPI D-PHY compliance test software from Rohde & Schwarz

Test & Measurement

The new R&S RTO-K26 MIPI D-PHY compliance test software from Rohde & Schwarz offers automated tests in line with the current v1.1 specifications of the MIPI® Alliance and the University of New Hampshire InterOperability Laboratory (UNH-IOL). 


Read More

R&S RTM oscilloscopes from Rohde & Schwarz lead in analysis of long signal sequences

The R&S RTM-K15 history and segmented memory option expands the maximum memory depth of the R&S RTM bench oscilloscope from Rohde & Schwarz to an unprecedented 460 Msample per channel. The segmented memory has a variable depth ranging from 10 ksample to 20 Msample, enabling acquisition of up to 45,000 individual waveform segments. 


Read More

Anite launches Nemo Invex II benchmarking system for wireless networks

Anite has launched Nemo Invex II, its latest state-of-the-art benchmarking solution for operators, wireless infrastructure vendors, certification laboratories and regulatory bodies.


Read More

Keysight extends frequency range of existing X-Series signal analyzers

Keysight Technologies, Inc. announced frequency-extension upgrades for its PXA, MXA and EXA  X-Series signal analyzers. Currently, no other manufacturer provides the opportunity to upgrade frequency range after the initial purchase of a signal analyzer. 


Read More

IMAGE GALLERIES

Autotestcon 2013

Schaumburg, IL

EVENTS

Webinars

Design Challenges for Handset Power Amplifiers due to LTE-Advanced

12/10/14

Rohde & Schwarz
Technical Education Webinar Series

Read More

DOCUMENTS AND FILES

A Simple Approach to Signal Via Stubs for Coaxial PCB Connector Launches

When designing printed circuit boards launches for coaxial test connectors, there are a number of aspects to consider in order to get the clearest picture of the intended device under test. Learn a relatively simple approach to modeling back-drilled vias and a rough "rule of thumb" to modeling them without electrical modeling tools.

Build Applications Tailored for Remote Signal Monitoring with the Signal Hound BB60C

The Signal Hound BB60C operates and is powered by connecting to a host PC through a USB 3.0 cable. Remote spectrum analyzer and PC management tasks are accomplished over an Ethernet connection through the use of a low cost Intel vPro- enabled PC, such as the Intel NUC, model DC53427HYE, paired with each BB60C. Intel's vPro technology keeps the Ethernet port powered on, even when the Core i5 processor is turned off, so that it can always receive commands.

Calculating a Calibration Factor

Technicians and engineers use calibration factors when making measurements; but where do these calibration factors really come from?

Modern Architecture Advances Vector Network Analyzer Performance

Modern Vector Network Analyzer (VNA) architectures such as those based on Nonlinear Transmission Line (NLTL) samplers and distributed harmonic generators now offer a beneficial alternative to traditional sampling VNAs. They allow for a simplified architecture and also enable VNAs that are much more cost effective. It is shown that NLTL technology results in miniature VNA reflectometers that provide enhanced performance over broad frequency ranges, and reduced measurement complexity, providing VNA users a unique and compelling solution for their high-frequency measurement needs.

Increase Power Amplifier Test Throughput with the Keysight PXIe Vector Signal Generator and Analyzers

Read this application note for an overview of the key challenges in testing power amplifiers and front end modules with envelope tracking. Learn about how to reduce test cost, achieve fast throughput, and maintain high test quality using the modular Keysight M9381A PXIe VSG, and the M9391A or M9393A PXIe VSA, as well as how to perform high speed harmonic test using the M9393A PXIe VSA.

Output Standing Wave Ratio (SWR) Test Using the TEGAM 1830A RF Power Meter

Do you have confidence that your 50 MHz reference port Standing Wave Ratio (SWR) is within specifications? It is important to have this confidence and by adhering to these procedures, you can be certain that your 50 MHz reference is within the manufactures tolerance!

Techniques for Precise Cable and Antenna Measurements in the Field Using Agilent FieldFox Handheld Analyzers

This application note introduces the practical aspects of cable and antenna testing. It covers interpreting measurement results and instrument operation including calibration options such as CalReady and QuickCal using FieldFox configured as a cable and antenna analyzer. Measurement examples are provided showing techniques for measuring insertion loss, return loss, and locating faults in a transmission system.

Testing S-Parameters on Pulsed Radar Power Amplifier Modules

This Application Note describes testing S-parameters under pulsed conditions. A constant power level calibration is included. A LDMOS S-band radar power transistor is used as example DUT. The pulse profile mode of the R&S ZVA is used to analyze the time-dependent behavior of the DUT.

Wavelex Products Facilitate Both Multi-octave Bench Testing and Multi-system Testing

This paper addresses the use of Wavelex wideband products in test setups for multi-octave and multi-system testing, as well as the advantages of using these wideband products for the testing of narrowband systems. Specific products are presented, along with an example test setup that allows for multi-system testing of ISM 868 MHz, ISM 915 MHz, and avionics transponders at 978 MHz, 1030 MHz, and 1090 MHz, without the need to change components.

Eliminating the Tradeoffs and Limitations of Your Pulse Measurement Test Solution

Next generation radar systems face multiple difficult demands. The pace and variety of new requirements need multi-use/function/mode adaptive radars, to be used for different applications. This whitepaper reviews existing pulse measurement test methods; discusses advantages/limitations; and introduces new test method that takes advantage of high-speed digitizing architecture, offering the industryâ??s highest resolution/timing accuracy level.

Sign-In

Forgot your password?

No Account? Sign Up!

Get access to premium content and e-newsletters by registering on the web site.  You can also subscribe to Microwave Journal magazine.

Sign-Up

advertisment Advertisement