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Test and Measurement Channel

Test and Measurement related topics

ARTICLES

Keysight Technologies introduces EXM Wireless Test Set capabilities

Keysight Technologies Inc. announced new capabilities for the EXM wireless test set.The capabilities were added to address the latest technology evolutions in wireless communications with support for WLAN 802.11p, 802.11ah, 802.11ac Wave 2 Measurements, and Bluetooth® 4.2. The EXM now can make the measurements required to efficiently manufacture today’s and tomorrow’s Internet-of-Things wireless devices.


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Keysight's EXF supports high-volume manufacturing of femtocells with Broadcom chipsets

Keysight Technologies Inc. announced that its E6650A EXF wireless test set for femtocell now supports high-volume manufacturing test for designs using Broadcom Corp.’s BCM617xx series small cell chipsets. The EXF one-box tester delivers the speed, performance and scalability today’s manufacturers need to quickly ramp up production and lower its cost-of-test.


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Focus acquires assets of Auriga

On the move after Mesuro acquisition

Focus Microwaves of Montreal, Quebec announced that it has acquired the Pulsed IV and Bias-Tee lines of AURIGA Microwave, of Chelmsford, Mass. Focus also hired key Auriga personnel, in order to support customers, fulfill existing and pending pulse system orders and to push further product development.


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IMAGE GALLERIES

Autotestcon 2013

Schaumburg, IL

EVENTS

Webinars

One Size Does Not Fit All - Choose the Right Instrument Form Factor

3/11/15

Keysight Logo    Keysight Technologies Webcast

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Webinars

Bridging the Gap from Benchtop to PXI: A Common Software Strategy

3/26/15

Keysight Logo    Keysight Technologies Webcast

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DOCUMENTS AND FILES

A Simple Approach to Signal Via Stubs for Coaxial PCB Connector Launches

When designing printed circuit boards launches for coaxial test connectors, there are a number of aspects to consider in order to get the clearest picture of the intended device under test. Learn a relatively simple approach to modeling back-drilled vias and a rough "rule of thumb" to modeling them without electrical modeling tools.

Build Applications Tailored for Remote Signal Monitoring with the Signal Hound BB60C

The Signal Hound BB60C operates and is powered by connecting to a host PC through a USB 3.0 cable. Remote spectrum analyzer and PC management tasks are accomplished over an Ethernet connection through the use of a low cost Intel vPro- enabled PC, such as the Intel NUC, model DC53427HYE, paired with each BB60C. Intel's vPro technology keeps the Ethernet port powered on, even when the Core i5 processor is turned off, so that it can always receive commands.

Calculating a Calibration Factor

Technicians and engineers use calibration factors when making measurements; but where do these calibration factors really come from?

Modern Architecture Advances Vector Network Analyzer Performance

Modern Vector Network Analyzer (VNA) architectures such as those based on Nonlinear Transmission Line (NLTL) samplers and distributed harmonic generators now offer a beneficial alternative to traditional sampling VNAs. They allow for a simplified architecture and also enable VNAs that are much more cost effective. It is shown that NLTL technology results in miniature VNA reflectometers that provide enhanced performance over broad frequency ranges, and reduced measurement complexity, providing VNA users a unique and compelling solution for their high-frequency measurement needs.

Increase Power Amplifier Test Throughput with the Keysight PXIe Vector Signal Generator and Analyzers

Read this application note for an overview of the key challenges in testing power amplifiers and front end modules with envelope tracking. Learn about how to reduce test cost, achieve fast throughput, and maintain high test quality using the modular Keysight M9381A PXIe VSG, and the M9391A or M9393A PXIe VSA, as well as how to perform high speed harmonic test using the M9393A PXIe VSA.

Output Standing Wave Ratio (SWR) Test Using the TEGAM 1830A RF Power Meter

Do you have confidence that your 50 MHz reference port Standing Wave Ratio (SWR) is within specifications? It is important to have this confidence and by adhering to these procedures, you can be certain that your 50 MHz reference is within the manufactures tolerance!

Techniques for Precise Cable and Antenna Measurements in the Field Using Agilent FieldFox Handheld Analyzers

This application note introduces the practical aspects of cable and antenna testing. It covers interpreting measurement results and instrument operation including calibration options such as CalReady and QuickCal using FieldFox configured as a cable and antenna analyzer. Measurement examples are provided showing techniques for measuring insertion loss, return loss, and locating faults in a transmission system.

Testing S-Parameters on Pulsed Radar Power Amplifier Modules

This Application Note describes testing S-parameters under pulsed conditions. A constant power level calibration is included. A LDMOS S-band radar power transistor is used as example DUT. The pulse profile mode of the R&S ZVA is used to analyze the time-dependent behavior of the DUT.

Wavelex Products Facilitate Both Multi-octave Bench Testing and Multi-system Testing

This paper addresses the use of Wavelex wideband products in test setups for multi-octave and multi-system testing, as well as the advantages of using these wideband products for the testing of narrowband systems. Specific products are presented, along with an example test setup that allows for multi-system testing of ISM 868 MHz, ISM 915 MHz, and avionics transponders at 978 MHz, 1030 MHz, and 1090 MHz, without the need to change components.

Eliminating the Tradeoffs and Limitations of Your Pulse Measurement Test Solution

Next generation radar systems face multiple difficult demands. The pace and variety of new requirements need multi-use/function/mode adaptive radars, to be used for different applications. This whitepaper reviews existing pulse measurement test methods; discusses advantages/limitations; and introduces new test method that takes advantage of high-speed digitizing architecture, offering the industryâ??s highest resolution/timing accuracy level.

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