New analysis from Frost & Sullivan, "PXI Market to Change the Face of the Test and Measurement Industry", finds that the market earned revenues of $563.3 million in 2013 and estimates this to reach $1.75 billion by 2020.
Keysight Technologies, Inc. introduced the N7614B Signal Studio for Power Amplifier (PA) Test; an all-in-one, general-purpose test suite designed to help engineers improve PA efficiency through support for crest factor reduction (CFR), envelope tracking (ET) and digital pre-distortion (DPD) technologies.
Anritsu Corp. announced it has entered in to a Manufacturing Test License (MTL) agreement with Broadcom Corp. Anritsu’s modular MT8870A Universal Wireless Test Set enables cellular, wireless connectivity, location-based services (LBS) and other technologies to be tested in a single solution. Through the MTL agreement, Anritsu is able to provide certified calibration and verification test solutions to Broadcom WLAN and Bluetooth customers.
Read this application note for an overview of the key challenges in testing power amplifiers and front end modules with envelope tracking. Learn about how to reduce test cost, achieve fast throughput, and maintain high test quality using the modular Keysight M9381A PXIe VSG, and the M9391A or M9393A PXIe VSA, as well as how to perform high speed harmonic test using the M9393A PXIe VSA.
Do you have confidence that your 50 MHz reference port Standing Wave Ratio (SWR) is within specifications? It is important to have this confidence and by adhering to these procedures, you can be certain that your 50 MHz reference is within the manufactures tolerance!
This application note introduces the practical aspects of cable and antenna testing. It covers interpreting measurement results and instrument operation including calibration options such as CalReady and QuickCal using FieldFox configured as a cable and antenna analyzer. Measurement examples are provided showing techniques for measuring insertion loss, return loss, and locating faults in a transmission system.
This Application Note describes testing S-parameters under pulsed conditions. A constant power level calibration is included. A LDMOS S-band radar power transistor is used as example DUT. The pulse profile mode of the R&S ZVA is used to analyze the time-dependent behavior of the DUT.
This paper addresses the use of Wavelex wideband products in test setups for multi-octave and multi-system testing, as well as the advantages of using these wideband products for the testing of narrowband systems. Specific products are presented, along with an example test setup that allows for multi-system testing of ISM 868 MHz, ISM 915 MHz, and avionics transponders at 978 MHz, 1030 MHz, and 1090 MHz, without the need to change components.
Next generation radar systems face multiple difficult demands. The pace and variety of new requirements need multi-use/function/mode adaptive radars, to be used for different applications. This whitepaper reviews existing pulse measurement test methods; discusses advantages/limitations; and introduces new test method that takes advantage of high-speed digitizing architecture, offering the industryâ??s highest resolution/timing accuracy level.
AR RF/Microwave Instrumentation offers a broad range of power amplifiers covering DC to 45 GHz with output power ranging from 1 to 16,000 watts. While applications include Electromagnetic Compatibility testing (EMC), RF component testing, physics (plasma generation) and chemistry (mass spectroscopy) applications, military (jammers, radar), material testing (ultrasound), medical diagnostic testing (NMR, MRI) and general lab use, this applications note focuses on a line of amplifiers that has been optimized for wireless telecommunications test use.
This application note describes typical satellite applications that require power measurements and recommends power measurement solutions. It also explains how these solutions can help simplify your work, and improve accuracy, reliability and test coverage. Also covered are new sensor functions such as built-in Gamma and S-parameter corrections and real time measurement uncertainty calculations for improved accuracy.
The need to measure spurious and harmonic signals is not new. However, emerging requirements include more of these measurements and specify demanding test conditions. In aerospace and defense applications, the task may be a search for known or unknown signals across a broad spectrum. In wireless communications, the need is to characterize increasingly complex devices in an ever-expanding number of conditions and device states - and do so as quickly as possible.
This application note provides an overview of field testing radar systems and Line Replaceable Units (LRU) using high-performanceÃ?Â FieldFox combination analyzers having multiple measurement modes including a peak power analyzer, vector network analyzer, spectrum analyzer and vector voltmeter. This application note will show several measurement examples of pulsed and secondary radar signals and also reviews the basics ofÃ?Â monopulse radar.