advertisment Advertisement
This ad will close in  seconds. Skip now
advertisment Advertisement
advertisment Advertisement
advertisment Advertisement
advertisment Advertisement

Test and Measurement Channel

Test and Measurement related topics

ARTICLES

Anritsu's new field analyzer with integrated PIM & line sweep testing capability

Anritsu Company
No Comments

 Anritsu Co. breaks new ground in field wireless test with the introduction of the MW82119B PIM Master™, which combines a 40 W, battery-operated PIM analyzer with a 2 MHz to 3 GHz cable and antenna analyzer, eliminating the need to carry multiple instruments to measure the RF performance of a cell site.  


Read More

Keysight introduces new signal processing firmware for their PCIe digitizers

Keysight Technologies, Inc.
No Comments

 Keysight Technologies, Inc. announced the availability of new signal processing firmware for its family of U53xxA PCIe digitizers. The new firmware (option -TSR) allows simultaneous capture and transfer of acquired data in triggered applications. 


Read More

R & S RTO oscilloscopes with triggering and decoding option

Test & Measurement
Rohde & Schwarz
No Comments

 The R&S RTO-K40 MIPI RFFE serial triggering and decoding option from Rohde & Schwarz is a powerful solution that enables developers of RF front ends and modules with RF front end (RFFE) control interface to verify and debug designs and put these components into operation. 


Read More

Averna introduces cable industry’s first DOCSIS 3.1 protocol analyzer

Averna
No Comments

 Averna, an industry-leading developer of test solutions and services for communications and electronics device-makers worldwide, announced the industry’s first DOCSIS 3.1 protocol analysis solution.  


Read More

Keysight donates oscilloscopes to university engineering programs

Keysight Technologies, Inc.
No Comments

 Keysight Technologies, Inc. announced it has donated an MSOX4154A oscilloscope to each of the universities supporting the company’s student internship program. The universities include: 


Read More

Keysight introduces one-box tester dedicated to femtocell manufacturing

Keysight Technologies, Inc.
No Comments

 Keysight Technologies, Inc. announced the E6650A EXF wireless test set, the industry’s first one-box tester dedicated to femtocell manufacturing.  


Read More

Keysight's UXM wireless test set expands functional test capabilities

Keysight Technologies, Inc.
No Comments

 Keysight Technologies, Inc. announced new functionality enhancements to the E7515A UXM wireless test set including support for LTE-A category 7 data throughput, expanded functional test capabilities, and in-depth RF performance verification using the industry standard X-Series measurement applications. 


Read More

Aeroflex adds 26.5 GHz capability to the 7700 integrated microwave test system

Aeroflex Inc.
No Comments

 Aeroflex Inc., a wholly owned subsidiary of Aeroflex Holding Corp., announced the 26.5 GHz high-frequency extension for the 7700 integrated microwave test system.  


Read More

Teledyne LeCroy's new 500 MHz, $5,000 WaveJet Touch portable oscilloscope

Teledyne LeCroy
No Comments

 Teledyne LeCroy introduces the WaveJet Touch oscilloscope, providing an unprecedented combination of performance and price — 500 MHz for $5,000. The availability of a touch screen as well as powerful debug tools and advanced triggering is unique among oscilloscopes with comparable specifications and pricing.  


Read More

Keysight's new full two-port 26.5 GHz vector network analyzers fit in one PXI slot

Test & Measurement
Keysight Technologies, Inc.
No Comments

 Keysight Technologies, Inc. announced a series of one-slot PXI vector network analyzers that cover 300 kHz up to 26.5 GHz. The new analyzers offer the best PXI VNA performance on key specifications such as speed, trace noise, stability and dynamic range. 


Read More

IMAGE GALLERIES

Autotestcon 2013

Schaumburg, IL

DOCUMENTS AND FILES

Calculating a Calibration Factor

Technicians and engineers use calibration factors when making measurements; but where do these calibration factors really come from?

Modern Architecture Advances Vector Network Analyzer Performance

Modern Vector Network Analyzer (VNA) architectures such as those based on Nonlinear Transmission Line (NLTL) samplers and distributed harmonic generators now offer a beneficial alternative to traditional sampling VNAs. They allow for a simplified architecture and also enable VNAs that are much more cost effective. It is shown that NLTL technology results in miniature VNA reflectometers that provide enhanced performance over broad frequency ranges, and reduced measurement complexity, providing VNA users a unique and compelling solution for their high-frequency measurement needs.

Increase Power Amplifier Test Throughput with the Keysight PXIe Vector Signal Generator and Analyzers

Read this application note for an overview of the key challenges in testing power amplifiers and front end modules with envelope tracking. Learn about how to reduce test cost, achieve fast throughput, and maintain high test quality using the modular Keysight M9381A PXIe VSG, and the M9391A or M9393A PXIe VSA, as well as how to perform high speed harmonic test using the M9393A PXIe VSA.

Output Standing Wave Ratio (SWR) Test Using the TEGAM 1830A RF Power Meter

Do you have confidence that your 50 MHz reference port Standing Wave Ratio (SWR) is within specifications? It is important to have this confidence and by adhering to these procedures, you can be certain that your 50 MHz reference is within the manufactures tolerance!

Techniques for Precise Cable and Antenna Measurements in the Field Using Agilent FieldFox Handheld Analyzers

This application note introduces the practical aspects of cable and antenna testing. It covers interpreting measurement results and instrument operation including calibration options such as CalReady and QuickCal using FieldFox configured as a cable and antenna analyzer. Measurement examples are provided showing techniques for measuring insertion loss, return loss, and locating faults in a transmission system.

Testing S-Parameters on Pulsed Radar Power Amplifier Modules

This Application Note describes testing S-parameters under pulsed conditions. A constant power level calibration is included. A LDMOS S-band radar power transistor is used as example DUT. The pulse profile mode of the R&S ZVA is used to analyze the time-dependent behavior of the DUT.

Wavelex Products Facilitate Both Multi-octave Bench Testing and Multi-system Testing

This paper addresses the use of Wavelex wideband products in test setups for multi-octave and multi-system testing, as well as the advantages of using these wideband products for the testing of narrowband systems. Specific products are presented, along with an example test setup that allows for multi-system testing of ISM 868 MHz, ISM 915 MHz, and avionics transponders at 978 MHz, 1030 MHz, and 1090 MHz, without the need to change components.

Eliminating the Tradeoffs and Limitations of Your Pulse Measurement Test Solution

Next generation radar systems face multiple difficult demands. The pace and variety of new requirements need multi-use/function/mode adaptive radars, to be used for different applications. This whitepaper reviews existing pulse measurement test methods; discusses advantages/limitations; and introduces new test method that takes advantage of high-speed digitizing architecture, offering the industryâ??s highest resolution/timing accuracy level.

Wireless Telecommunications Testing with "S" Series Microwave Power Amplifiers

AR RF/Microwave Instrumentation offers a broad range of power amplifiers covering DC to 45 GHz with output power ranging from 1 to 16,000 watts. While applications include Electromagnetic Compatibility testing (EMC), RF component testing, physics (plasma generation) and chemistry (mass spectroscopy) applications, military (jammers, radar), material testing (ultrasound), medical diagnostic testing (NMR, MRI) and general lab use, this applications note focuses on a line of amplifiers that has been optimized for wireless telecommunications test use.

Long-Term, Remote Monitoring of Satellite Performance Using an Agilent High-Frequency USB Power Sensor

This application note describes typical satellite applications that require power measurements and recommends power measurement solutions. It also explains how these solutions can help simplify your work, and improve accuracy, reliability and test coverage. Also covered are new sensor functions such as built-in Gamma and S-parameter corrections and real time measurement uncertainty calculations for improved accuracy.

Sign-In

Forgot your password?

No Account? Sign Up!

Get access to premium content and e-newsletters by registering on the web site.  You can also subscribe to Microwave Journal magazine.

Sign-Up

advertisment Advertisement