Items Tagged with 'performance'

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Volta Series Probe

Smiths Interconnect announces the release of the Volta Series probe heads optimized for wafer level chip scale package testing. Volta is used for testing the chips (while in their wafer form) that are behind everything from Bluetooth and power management to digital display controllers. Volta helps customers deliver higher quality products by ensuring the chips in them are up to specification, and perform as they should.


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Keysight Technologies to Help Accelerate Deployment of IoT Technology Using Qualcomm™ Technologies’ LTE IoT Modems

Keysight Technologies, Inc. announced their plan to help accelerate the deployment of Internet of Things (IoT) technologies. IoT capabilities is expected to help connect billions of devices with applications—such as smart homes, connected cars, healthcare and smart cities; as well as industrial applications, including energy systems, agriculture and transportation.


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New Tech Brief: How Phase Noise Affects Radar and Communications Systems

Custom MMIC has published a free technical brief, “Addressing Your Phase Noise Challenges in Radar and Communication Systems,” illuminating key aspects of how phase noise impacts signal quality in radar and communication systems. The tech brief provides insight into product solutions that can be used in radar and communication systems that are phase noise constrained.


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