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Items Tagged with 'angelov-gan'

ARTICLES

Agilent unveils new IC-CAP platform for device characterization and modeling

EDAFocus
December 20, 2012

With IC-CAP 2013.01, Agilent introduces major improvements to its flagship product for high-frequency device modeling. One key improvement is turnkey extraction of the Angelov-GaN model, the industry standard compact device model for GaN semiconductor devices.


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